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International Standard Category: Semiconducting materials

GB/T 14146-2009    Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
硅外延层载流子浓度测定 汞探针电容-电压法;
Category No.:29.045 Valid Status:superseded
Issued Organization:AQSIQ, SAC Issued Date:2009-10-30
Implemented Date:2010-6-1 Abolished Date:
Superseded Standard.:GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers - Capacitance-voltage method
Superseded Date:2021-12-1
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