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| International Standard Category: Semiconducting materials |
GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes
用栅控和非栅控二极管的电压电容关系测定硅外延层中净载流子浓度的方法;
| Category No.: | 29.045 | Valid Status: | abolished |
| Issued Organization: | AQSIQ;SAC | Issued Date: | 2013-12-31 |
| Implemented Date: | 2014-8-15 | Abolished Date: | 2017-12-19 |
| Superseded Standard.: | Superseded Date: |
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