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| International Standard Category: Semiconducting materials |
GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography
热解吸气相色谱法测定硅片表面的有机污染物;
| Category No.: | 29.045 | Valid Status: | valid |
| Issued Organization: | AQSIQ;SAC | Issued Date: | 2009-10-30 |
| Implemented Date: | 2010-6-1 | Abolished Date: | |
| Superseded Standard.: | Superseded Date: |
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