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| International Standard Category: Semiconducting materials |
GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities
低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法;
| Category No.: | 29.045 | Valid Status: | superseded |
| Issued Organization: | AQSIQ;SAC | Issued Date: | 2009-10-30 |
| Implemented Date: | 2010-6-1 | Abolished Date: | |
| Superseded Standard.: | GB/T 24581-2022 |
Superseded Date: | 2022-10-1 |
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