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| International Standard Category: Testing of metals in general |
GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
非本征半导体单晶霍尔迁移率和霍尔系数测量方法;
| Category No.: | 77.040.01 | Valid Status: | valid |
| Issued Organization: | AQSIQ;SAC | Issued Date: | 2006-7-18 |
| Implemented Date: | 2006-11-1 | Abolished Date: | |
| Superseded Standard.: | Superseded Date: |
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