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International Standard Category: Semiconducting materials

GB/T 6618-2009    Test method for thickness and total thickness variation of silicon slices
硅片厚度和总厚度变化测试方法;
Category No.:29.045 Valid Status:valid
Issued Organization:AQSIQ, SAC Issued Date:2009-10-30
Implemented Date:2010-6-1 Abolished Date:
Superseded Standard.: Superseded Date:
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