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| Chinese National Standard Category: Semiconductor integrated circuit |
| English Title: | Examination methods for similarity comparison of integrated circuit chips |
| Chinese Title: | 芯片相似性比对检方方法 |
| Standard No.: | GA/T 1171-2014 |
| Category No.: | L56 |
| Issued by: | Ministry of Public Security |
| Issued on: | 2014-07-09 |
| Implemented on: | 2014-7-9 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 4000 words |
| Similar Standards: | T/CIE 079-2020 T/CIE 074-2020 T/CIE 067-2020 T/CIE 077-2020 T/CIE 072-2020 T/CIE 073-2020 T/CIE 155-2023 T/CIE 075-2020 T/CIE 069-2020 GB/T 13067-1991 T/CIE 071-2020 GB 9615-1988 T/CIE 068-2020 GB 7503-1987 T/CIE 081-2020 T/CIE 080-2020 T/CIE 070-2020 T/CIE 076-2020 GB/T 14027.6-1992 GB 6797-1986 |
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