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Chinese National Standard Category: Nuclear instrument and detector in general |
English Title: | Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers |
Chinese Title: | 半导体X射线探测器系统和半导体X射线能谱仪的测量方法 |
Standard No.: | GB/T 11685-2003 |
Category No.: | F80 |
Issued by: | 国防科学技术工业委员会 |
Issued on: | 2003-07-07 |
Implemented on: | 2004-1-1 |
Status: | valid |
Superseded by: | |
Superseded on: | |
Abolished on: | |
Superseding: | GB/T 8992-1988 Test procedures for Si(Li) X-ray--Detector systems GB/T 11685-1989 Test procedures for semiconductor X-ray energy spectrometers |
Word Count: | 13000 words |
Similar Standards: | GB/T 10257-1988 GB 12127-1989 GB/T 41991-2022 GB/T 41143-2021 GB/T 19661.2-2015 GB/T 2900.81-2008 GB/T 2900.82-2008 GB/T 10261-2008 GB/T 10263-2006 GB/T 19661.1-2005 GB/T 19661.2-2005 GB/T 11685-2003 GB/T 13181-2002 GB/T 10257-2001 GB/T 8993-1998 GB/T 7167-1996 GB/T 5201-1994 GB/T 4079-1994 GB/T 12790-1991 GB/T 11685-1989 |
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