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Chinese National Standard Category: Semimetal and semiconductor material in general

English Title: Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
Chinese Title: 硅和锗体内少数载流子寿命测定光电导衰减法
Standard No.: GB/T 1553-2009
Category No.: H80
Issued by: AQSIQ, SAC
Issued on: 2009-10-30
Implemented on: 2010-6-1
Status: superseded
Superseded by:GB/T 1553-2023
Superseded on:2024-3-1
Abolished on:
Superseding:
Word Count:7000 words
Similar Standards: GB/T 37051-2018   GB/T 29507-2013   GB/T 29057-2023   GB/T 16596-2019   GB/T 16595-2019   GB/T 14844-2018   GB/T 8756-2018   GB/T 34479-2017   GB/T 32279-2015   YS/T 985-2014   GB/T 30453-2013   GB/T 14863-2013   GB/T 30110-2013   GB/T 29505-2013   GB/T 29057-2012   YS/T 838-2012   GB/T 26069-2010   GB/T 26071-2010   GB/T 26068-2010   GB/T 14847-2010  
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