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Chinese National Standard Category: Magnifier and microscope

English Title: Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Chinese Title: 微束分析 扫描电镜 图像放大倍率校准导则
Standard No.: GB/T 27788-2011
Category No.: N32
Issued by: AQSIQ,SAC
Issued on: 2011-12-30
Implemented on: 2012-8-1
Status: superseded
Superseded by:GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Superseded on:2021-4-1
Abolished on:
Superseding:
Word Count:9000 words
Similar Standards: T/ZZB 0121-2016   GB 2609-1981   GB/T 42886-2023   GB/T 27668-2023   GB/T 22062-2020   GB/T 27788-2020   GB/T 22059-2018   GB/T 22063-2018   GB/T 22056-2018   GB/T 36539-2018   GB/T 36529-2018   GB/T 2609-2015   GB/T 19864.1-2013   GB/T 19864.2-2013   GB/T 27788-2011   GB/T 26600-2011   GB/T 26601-2011   GB/T 24665-2009   GB/T 2985-2008   GB/T 22057.2-2008  
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