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Chinese National Standard Category: Semiconductor discrete devices in general

English Title: Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination
Chinese Title: 半导体器件 机械和气候试验方法 第3部分:外部目检
Standard No.: GB/T 4937.3-2012
Category No.: L40
Issued by: AQSIQ,SAC
Issued on: 2012-11-5
Implemented on: 2013-2-15
Status: valid
Superseded by:
Superseded on:
Abolished on:
Superseding:
Word Count:4000 words
Similar Standards: T/CIE 145-2022   T/CIE 116-2021   T/CIE 147-2022   T/CIE 119-2021   GB/T 4937.26-2023   GB/T 4587-2023   GB/T 42709.19-2023   GB/T 4937.42-2023   GB/T 4937.27-2023   GB/T 42709.7-2023   GB/T 4937.32-2023   GB/T 4937.31-2023   GB/T 4937.23-2023   GB/T 42706.5-2023   GB/T 42706.2-2023   GB/T 42709.5-2023   GB/T 4937.17-2018   GB/T 4937.30-2018   GB/T 4937.14-2018   GB/T 4937.15-2018  
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