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Chinese National Standard Category: Semiconductor integrated circuit

English Title: Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instruments
Chinese Title: 半导体集成电路 机电仪专用数字电路测试方法
Standard No.: JB/T 5580-1991
Category No.: L56
Issued by:
Issued on: 1991-07-16
Implemented on: 1992-7-1
Status: abolished
Superseded by:
Superseded on:
Abolished on:2010-01-20
Superseding:ZB N23001-1988
Word Count:3500 words
Similar Standards: T/CIE 079-2020   T/CIE 074-2020   T/CIE 067-2020   T/CIE 077-2020   T/CIE 072-2020   T/CIE 073-2020   T/CIE 155-2023   T/CIE 075-2020   T/CIE 069-2020   GB/T 13067-1991   T/CIE 071-2020   GB 9615-1988   T/CIE 068-2020   GB 7503-1987   T/CIE 081-2020   T/CIE 080-2020   T/CIE 070-2020   T/CIE 076-2020   GB/T 14027.6-1992   GB 6797-1986  
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