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Chinese National Standard Category: Semiconductor integrated circuit |
English Title: | Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instruments |
Chinese Title: | 半导体集成电路 机电仪专用数字电路测试方法 |
Standard No.: | JB/T 5580-1991 |
Category No.: | L56 |
Issued by: | |
Issued on: | 1991-07-16 |
Implemented on: | 1992-7-1 |
Status: | abolished |
Superseded by: | |
Superseded on: | |
Abolished on: | 2010-01-20 |
Superseding: | ZB N23001-1988 |
Word Count: | 3500 words |
Similar Standards: | T/CIE 079-2020 T/CIE 074-2020 T/CIE 067-2020 T/CIE 077-2020 T/CIE 072-2020 T/CIE 073-2020 T/CIE 155-2023 T/CIE 075-2020 T/CIE 069-2020 GB/T 13067-1991 T/CIE 071-2020 GB 9615-1988 T/CIE 068-2020 GB 7503-1987 T/CIE 081-2020 T/CIE 080-2020 T/CIE 070-2020 T/CIE 076-2020 GB/T 14027.6-1992 GB 6797-1986 |
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