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Chinese National Standard Category: Micro and copier machinery |
English Title: | Standard test method for surface defect of photoconductor for electrostatic process |
Chinese Title: | 静电复印感光体表面缺陷 测量方法 |
Standard No.: | JB/T 8268-1999 |
Category No.: | N47 |
Issued by: | 国家机械工业局 |
Issued on: | 1999-8-6 |
Implemented on: | 2000-1-1 |
Status: | superseded |
Superseded by: | JB/T 8268-2015 Standard test method for surface defect of photoconductor for electrostatic process |
Superseded on: | 2015-10-1 |
Abolished on: | |
Superseding: | JB 8268-1995GB |
Word Count: | 2000 words |
Similar Standards: | GB/T4591-2005 GB 10074-1988 GB 11000-1989 GB/T 10992-2022 GB/T 10073-2021 GB/T 21202-2018 GB/T 36677-2018 GB/T 36538-2018 GB/T 35583-2017 GB/T 35584-2017 GB/T 29794-2013 GB/T 29793-2013 GB/T 29792-2013 GB/T 29301-2012 GB/T 28625-2012 GB/T 28626-2012 GB/T 10992.3-2008 GB/T 10992.1-2008 GB/T 16981-2008 GB/T 13334-2008 |
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