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Chinese National Standard Category: Technical management

English Title: Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes
Chinese Title: PIN、雪崩光电二极管反向击穿电压的测试方法
Standard No.: SJ 2354.2-1983
Category No.: F01
Issued by: MOEI
Issued on: 1983-8-15
Implemented on: 1984-7-1
Status: superseded
Superseded by:SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD
Superseded on:2015-10-1
Abolished on:
Superseding:
Word Count:1000 words
Similar Standards: DB31/T 1253-2020   DB31/ 742-2020   DB31/ 674-2020   DB31/ 506-2020   DB31/ 627-2020   DB31/T 1246-2020   DB31/T 595-2021   DB31/ 590-2012   DB31/ 652-2020   DB31/ 720-2020   DB31/T 34-2020   DB31/T 945.5-2020   DB31/ 574-2020   DB31/T 945.4-2020   GB/T 6421-1986   DB31/T 204-2021   DB31/T 25-2020   DB31/ 712-2020   DB31/T 1213-2020   DB31/T 214-2013  
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