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Chinese National Standard Category: Semiconductor emitting device |
English Title: | Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Capacitance |
Chinese Title: | 半导体红外发光二极管测试方法 电容的测试方法 |
Standard No.: | SJ 2658.4-1986 |
Category No.: | L53 |
Issued by: | |
Issued on: | |
Implemented on: | 1986-10-1 |
Status: | superseded |
Superseded by: | SJ/T 2658.4-2015 Measuring method for semiconductor infrared-emitting diode. Part 4: Total capacitance |
Superseded on: | 2016-4-1 |
Abolished on: | |
Superseding: | |
Word Count: | 2000 words |
Similar Standards: | T/CIE 093-2020 T/CIRA 9-2020 GB/T 15651.6-2023 GB/T 43590.102-2023 GB/T 20871.63-2021 GB/T 18910.201-2021 GB/T 18910.202-2021 GB/T 18910.203-2021 GB/T 18910.102-2021 GB/T 18910.61-2021 GB/T 39771.1-2021 GB/T 39771.2-2021 GB/T 36359-2018 GB/T 36356-2018 GB/T 36360-2018 GB/T 36357-2018 JB/T 10875-2008 SJ 53930/1-2002 GB 9492-1988 GB 9493-1988 |
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