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| Chinese National Standard Category: Technical management |
| English Title: | Semiconductor devices--Mechanical and climatic test methods |
| Chinese Title: | 半导体器件 机械和气候试验方法 |
| Standard No.: | SJ/Z 9016-1987 |
| Category No.: | C01 |
| Issued by: | |
| Issued on: | 1987-09-14 |
| Implemented on: | 1987-9-14 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | 参见GB/T 4937-1985 |
| Word Count: | 9500 words |
| Similar Standards: | T/CPMA 015.2-2020 T/CPMA 015.1-2020 T/CIQA 46-2023 T/CPMA 015.3-2020 T/CIQA 47-2022 T/CIQA 46-2022 DB31/T 1245-2020 DB33/T 2170-2018 WS/T 567-2017 WS/T 500.53-2016 DB43/T 1181-2016 WS/T 484-2015 DB31/T 930-2015 SB/T 11036-2013 SJ/T 11182-1998 SJ/T 11149-1997 SJ/T 11181-1998 SJ/T 11185-1998 SJ/T 11152-1998 SJ/T 11149.1-1997 |
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