Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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GB/T 14844-1993 of semiconductor materials 75.0 via email in 1~3 business day valid
GB/T 13389-2014 Practice for conversion between resistivity and dopant density for boron-doped,phosphorus-doped,and arsenic-doped silicon 410.0 via email in 1~5 business day valid
GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer 180.0 via email in 1~3 business day valid
GB/T 1558-2009 Test method for substitutional atomic carbon concent of silicon by infrared absorption 150.0 via email in 1~3 business day valid
GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge 150.0 via email in 1~3 business day valid
GB/T 5238-1995 Monocrystalline germanium 75.0 via email in 1~3 business day abolished
YS/T 223-1996 Selenium 105.0 via email in 1~3 business day abolished
GB/T 15023-1994 Test methods for solventless polymerisable resinous compounds used for electrical insulation 255.0 via email in 1~3 business day abolished
GB/T 25076-2010 Monocrystalline silicon of solar cell 150.0 via email in 1~3 business day valid
YS/T 23-1992 Thickness determination for silicon epitaxial layers - Stacking fault method 60.0 via email in 1~3 business day abolished
GB/T 14863-1993 test method for net carrier density in silicon epitaxial layers by voltage - Capacitance of gated and ungated diodes 150.0 via email in 1~3 business day abolished
GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells 180.0 via email in 1~3 business day valid
GB/T 19199-2003 Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 90.0 via email in 1~3 business day abolished
GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices 120.0 via email in 1~3 business day valid
GB/T 5654-1985 Measurement of relative permittivity,dielectric dissipation factor at power frequency and volume resistivity of insulating liquids 120.0 via email in 1~3 business day abolished
GB/T 12636-1990 Stripline test method for complex permittivity of microwave dielectric substrates 150.0 via email in 1~3 business day valid
GB/T 1409-1988 Methods for the determination of the permittivity and dielectric dissipation factor of solid electrical insulating materials at power,audio and radio frequencies including metre wavelengths 670.0 via email in business day abolished
GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array 180.0 via email in 1~3 business day valid
GB/T 3655-1992 Magnetic sheet and strip-Methods of measurement of magnetic electrical and physical properties 270.0 via email in 1~3 business day superseded
GB/T 6155-2008 Carbon materials-determination of the true density or porosity 90.0 via email in 1~3 business day valid
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