Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning 90.0 via email in 1~3 business day abolished
GB/T 14844-1993 of semiconductor materials 75.0 via email in 1~3 business day valid
GB/T 13389-2014 435.0 via email in 1~5 business day valid
GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer 180.0 via email in 1~3 business day valid
GB/T 1558-2009 Test method for substitutional atomic carbon concent of silicon by infrared absorption 180.0 via email in 1~3 business day valid
YS/T 224-1994 Thallium 30.0 via email in 1~3 business day to be superseded
GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge 180.0 via email in 1~3 business day valid
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method 180.0 via email in 1~3 business day valid
GB/T 5238-1995 Monocrystalline germanium 75.0 via email in 1~3 business day superseded
YS/T 223-1996 Selenium 105.0 via email in 1~3 business day superseded
GB/T 20229-2006 Gallium phosphide single crystal 90.0 via email in 1~3 business day valid
GB/T 15023-1994 Test methods for solventless polymerisable resinous compounds used for electrical insulation 255.0 via email in 1~3 business day abolished
GB/T 25076-2010 Monocrystalline silicon of solar cell 180.0 via email in 1~3 business day valid
GB/T 6553-1986 Test methods for evaluating resistance to tracking and erosion of electrical insulating materials us 105.0 via email in 1~3 business day superseded
YS/T 23-1992 Thickness determination for silicon epitaxial layers - Stacking fault method 60.0 via email in 1~3 business day superseded
GB/T 14863-1993 test method for net carrier density in silicon epitaxial layers by voltage - Capacitance of gated and ungated diodes 150.0 via email in 1~3 business day superseded
GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells 180.0 via email in 1~3 business day valid
GB 5019-1985 Mica products for electrical insulation--Methods of test 270.0 via email in 1~3 business day superseded
GB/T 19199-2003 Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 90.0 via email in 1~3 business day abolished
GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices 120.0 via email in 1~3 business day valid
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