Code of China Chinese Classification Professional Classification ICS Classification Latest Value-added Services

LoginRegister
JB/T 6842-1993   Test Method of Scanning Electron Microscope (English Version)
Standard No.: JB/T 6842-1993 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 5000 words Price(USD):150.0 remind me the price change
Implemented on:1994-1-1 Delivery: via email in 1~3 business day
Standard No.: JB/T 6842-1993
English Name: Test Method of Scanning Electron Microscope
Chinese Name: 扫描电子显微镜 试验方法
Chinese Classification: N33    Electron optics and other physical optics instrument
Professional Classification: JB    Professional Standard - Machinery
Issued by: Ministry of Machine Building
Issued on: 1993-7-9
Implemented on: 1994-1-1
Status: valid
Superseding:ZB Y340-1985
Language: English
File Format: PDF
Word Count: 5000 words
Price(USD): 150.0
Delivery: via email in 1~3 business day
Contact Us
Tel: +86-10-8572 5655
Fax: +86-10-8581 9515
Email: coc@codeofchina.com
QQ: 672269886
About Us   |    Contact Us   |    Terms of Service   |    Privacy   |    Cancellation & Refund Policy   |    Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886
Copyright: TransForyou(Beijing) Translation Co., Ltd. 2008-2020
 
 
Keywords:
JB/T 6842-1993, JB 6842-1993, JBT 6842-1993, JB/T6842-1993, JB/T 6842, JB/T6842, JB6842-1993, JB 6842, JB6842, JBT6842-1993, JBT 6842, JBT6842