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| Standard Insuued on: 1985-01 |
GB 5594.8-1985 Test methods for properties of structure ceramic used in electronic components; Determination of microstructure
电子元器件结构陶瓷材料性能测试方法 显微结构的测定
| Category No.: | GB | Valid Status: | superseded |
| Issued Organization: | China State Bureau of Standards | Issued Date: | 1985-01-01 |
| Implemented Date: | 1986-1-2 | Abolished Date: | |
| Superseded Standard.: | GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device―Part 8:Test method for microstructure |
Superseded Date: | 2016-1-1 |
GB/T 5531-1985
GB/T 5524-1985
GB/T 5604-1985
GB/T 5692-1985
GB/T 5694-1985
YY/T 91064-1999
GB/T 5729-2003
TZ 003-198501
TZ 004-198502
GB/T 5580-2001
GB/T 5687.2-1985
GB 5584.3-1985
GB/T 5687.3-1985
GB/T 5667-1985
GB 5741-1985
GB 5584.2-1985
GB/T 5632.2-1985
GB 5701-1985
GB/T 5639.2-1985
GB/T 5626.2-1985
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