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Standard Insuued on: 2003-11

GB/T 19403.1-2003    Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
半导体器件 集成电路 第11部分:第1篇:半导体集成电路 内部目检 (不包括混合电路)
Category No.:GB Valid Status:valid
Issued Organization:AQSIQ Issued Date:2003-11-24
Implemented Date:2004-8-1 Abolished Date:
Superseded Standard.: Superseded Date:
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JTJ/T 235-2003   GB/T 19387-2003   GB/T 1545.1-2003   SB/T 10353-2003   GB/T 18310.8-2003   GB/T 18310.11-2003   GB 18401-2003   GB/T 19404-2003   GB/T 18311.34-2003   GB/T 18310.17-2003   GB/T 18310.14-2003   GB/T 18310.9-2003   GB/T 18310.45-2003   GB/T 18794.4-2003   GB/T 18310.42-2003   GB/T 19405.2-2003   GB/T 18310.26-2003   GB/T 7424.4-2003   GB/T 19403.1-2003   GB/T 19247.3-2003  

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