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Standard Insuued on: 1984-04

GB/T 4326-1984    Extrinsic semiconductor single crystals; Measurement of Hall mobility and Hall coefficient
非本征半导体单晶霍尔迁移率和霍尔系数测量方法
Category No.:GB Valid Status:superseded
Issued Organization:China State Bureau of Standards Issued Date:1984-04-12
Implemented Date:1985-3-1 Abolished Date:2006-11-01
Superseded Standard.:GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
Superseded Date:2006-11-1
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GB/T 4289-1984   GB 3633-1983   GB/T 4358-1995   GB/T 4334.5-1990   GB/T 4356-1984   GB/T 4375.1-1984   GB/T 4375.12-1984   GB/T 4375.2-1984   GB/T 4373.2-1984   GB/T 4374.5-1984   GB/T 4375.11-1984   GB/T 4373.3-1984   GB/T 4373.4-1984   GB/T 4375.10-1984   GB/T 4370-1984   GB/T 4324.9-1984   GB/T 4346-1984   GB/T 4324.13-1984   GB/T 4324.14-1984   GB/T 4380-1984  

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