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| Standard Insuued on: 1983-08 |
SJ 2354.13-1983 Method of measurement for multiplication factor of PIN and avalanche photodiodes
ＰＩＮ、雪崩光电二极管倍增因子的测试方法
| Category No.: | SJ | Valid Status: | superseded |
| Issued Organization: | MOEI | Issued Date: | 1983-08-15 |
| Implemented Date: | 1984-7-1 | Abolished Date: | |
| Superseded Standard.: | SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD |
Superseded Date: | 2015-10-1 |
GB 3836.2-1983
GB 3836.4-1983
GB/T 3836.1-1983
GB 3836.1-1983
SJ 2354.12-1983
SJ 2354.13-1983
SJ 2354.4-1983
SJ 2354.8-1983
SJ 2354.11-1983
SJ 2354.6-1983
SJ 2354.1-1983
SJ 2354.9-1983
SJ 2354.5-1983
GB 3811-1983
GB 3823-1983
GB/T 3811-1983
GB 3822-1983
GB/T 3821-1983
HB 5834-1983
SJ 2348-1983
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