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| International Standard Category: Semiconducting materials |
GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon
硅单晶电阻率测定方法;
| Category No.: | 29.045 | Valid Status: | superseded |
| Issued Organization: | AQSIQ; SAC | Issued Date: | 2009-10-30 |
| Implemented Date: | 2010-6-1 | Abolished Date: | |
| Superseded Standard.: | GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method |
Superseded Date: | 2021-12-1 |
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