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| International Standard Category: Linear and angular measurements in general |
GB/T 16594-1996 Micron grade lenght measurement by SEM
微米级长度的扫描电镜测量方法 ;
| Category No.: | 17.040.01 | Valid Status: | superseded |
| Issued Organization: | STSB | Issued Date: | 1996-01-01 |
| Implemented Date: | 1997-4-1 | Abolished Date: | 2009-05-01 |
| Superseded Standard.: | GB/T 16594-2008 General rules for measurement of length in micron scale by SEM |
Superseded Date: | 2009-5-1 |
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