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| International Standard Category: Semiconducting materials |
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
硅片载流子复合寿命的无接触微波反射光电导衰减测试方法;
| Category No.: | 29.045 | Valid Status: | superseded |
| Issued Organization: | AQSIQ | Issued Date: | 2011-1-10 |
| Implemented Date: | 2011-10-1 | Abolished Date: | |
| Superseded Standard.: | GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method |
Superseded Date: | 2019-11-1 |
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