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International Standard Category: Semiconducting materials

GB/T 31854-2015    Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
光伏电池用硅材料中金属杂质含量的电感耦合等离子体质谱测量方法 ;
Category No.:29.045 Valid Status:valid
Issued Organization:AQSIQ, SAC Issued Date:2015-07-03
Implemented Date:2016-3-1 Abolished Date:
Superseded Standard.: Superseded Date:
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