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International Standard Category: Semiconducting materials

GB/T 4058-2009    Test method for detection of oxidation induced defects in polished silicon wafers
硅抛光片氧化诱生缺陷的检验方法;
Category No.:29.045 Valid Status:valid
Issued Organization:AQSIQ, SAC Issued Date:2009-10-30
Implemented Date:2010-6-1 Abolished Date:
Superseded Standard.: Superseded Date:
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