2025-12-21 216.73.216.41
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Code of China
Chinese National Standard List: Semiconductor discrete devices in general

GB/T 46567.1-2025 Intelligent computing - Test method for memristor - Part 1: Basic characteristics 
  Issued on: 2025-10-31   Translation Price(USD): 240.0
GB/T 4937.16-2025 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection(PIND) 
  Issued on: 2025-10-31   Translation Price(USD): 270.0
GB/T 45721.1-2025 Semiconductor devices—Stress migration test—Part 1: Copper stress migration test 
  Issued on: 2025-05-30   Translation Price(USD): 435.0
GB/T 45722-2025 Semiconductor devices—Constant current electromigration test 
  Issued on: 2025-05-30   Translation Price(USD): 270.0
GB/T 45719-2025 Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors 
  Issued on: 2025-05-30   Translation Price(USD): 270.0
GB/T 45718-2025 Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers 
  Issued on: 2025-05-30   Translation Price(USD): 315.0
GB/T 45716-2025 Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs) 
  Issued on: 2025-05-30   Translation Price(USD): 270.0
DB32/T 4894-2024 Test method for performance of micro-electromechanical systems semiconductor gas sensor 
  Issued on: 2024-11-07   Translation Price(USD):
GB 4938-1985 Acceptance and reliability for discrete semiconductor devices 
  Issued on: 1985-02-06   Translation Price(USD): 105.0
GB/T 4937.35-2024 Semiconductor devices—Mechanical and climatic test methods—Part 35: Acoustic microscopy for plastic encapsulated electronic components 
  Issued on: 2024-3-15   Translation Price(USD): 330.0
GB/T 4937.34-2024 Semiconductor devices—Mechanical and climatic test methods—Part 34:Power cycling 
  Issued on: 2024-3-15   Translation Price(USD): 210.0
ZB N 05005-1988  
  Issued on:   Translation Price(USD):
T/CIE 145-2022 Measurement method of radiation induced traps by deep level transient spectroscopy 
  Issued on: 2022-12-31   Translation Price(USD): 225.0
GB/T 4587-2023 Semiconductor devices—Discrete devices—Part 7:Bipolar transistors 
  Issued on: 2023-9-7   Translation Price(USD): 1275.0
DB13/T 5696-2023  
  Issued on: 2023-05-06   Translation Price(USD):
DB13/T 5695-2023  
  Issued on: 2023-05-06   Translation Price(USD):
GB/T 42709.19-2023 Semiconductor devices―Micro-electromechanical devices―Part 19:Electronic compasses 
  Issued on: 2023-08-06   Translation Price(USD): 435.0
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climatic test methods—Part 26: Electrostatic discharge (ESD) sensitivity testing—Human body model（HBM） 
  Issued on: 2023-9-7   Translation Price(USD): 800.0
T/CIE 116-2021 Fault tree analysis method and procedure of electronic components 
  Issued on: 2021-11-22   Translation Price(USD): 375.0
T/CIE 119-2021 Test method and procedure of atmospheric-neutron induced single event effects in semiconductor devices 
  Issued on: 2021-11-22   Translation Price(USD): 225.0
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