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Chinese National Standard Category: Special electronic technology material |
English Title: | for detecting dislocations of synthetic quartz crystal using X-ray topographic technique |
Chinese Title: | 人造石英晶体位错X射线形貌检测方法 |
Standard No.: | GB 11114-1989 |
Category No.: | L90 |
Issued by: | AQSIQ |
Issued on: | 1989-3-22 |
Implemented on: | 1990-3-1 |
Status: | abolished |
Superseded by: | |
Superseded on: | |
Abolished on: | 2017-12-15 |
Superseding: | 公告:国家标准公告2017年第31号 |
Word Count: | 2000 words |
Similar Standards: | T/CEMIA 028-2022 GB 9000.16-1988 T/CEMIA 035-2023 GB 9620.8-1988 GB/T 37275-2018 T/CEMIA 032-2022 T/CEMIA 030-2022 GB 9620.7-1988 T/CEMIA 027-2022 T/CEMIA 036-2023 T/CEMIA 026-2021 T/CEMIA 034-2023 T/CEMIA 029-2022 GB 9622.8-1988 T/CEMIA 024-2021 GB 9395.10-1988 T/CEMIA 021-2019 GB/T 9533-1988 T/CEMIA 023-2021 T/CI 236-2023 |
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