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| Chinese National Standard Category: Nuclear instrument and detector in general |
| English Title: | Test procedures for semiconductor X-ray energy spectrometers |
| Chinese Title: | 半导体X射线能谱仪的测试方法 |
| Standard No.: | GB/T 11685-1989 |
| Category No.: | F80 |
| Issued by: | |
| Issued on: | 1989-10-14 |
| Implemented on: | 1990-5-1 |
| Status: | superseded |
| Superseded by: | GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers |
| Superseded on: | 2004-1-1 |
| Abolished on: | 2004-01-01 |
| Superseding: | |
| Word Count: | 7500 words |
| Similar Standards: | GB/T 10257-1988 GB 12127-1989 GB/T 41991-2022 GB/T 41143-2021 GB/T 19661.2-2015 GB/T 2900.81-2008 GB/T 2900.82-2008 GB/T 10261-2008 GB/T 10263-2006 GB/T 19661.1-2005 GB/T 19661.2-2005 GB/T 11685-2003 GB/T 13181-2002 GB/T 10257-2001 GB/T 8993-1998 GB/T 7167-1996 GB/T 5201-1994 GB/T 4079-1994 GB/T 12790-1991 GB 12125-1989 |
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