Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array GB/T 1552-1995 - Chinese Category:GB/T 1552-1995

English Title:	Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
Chinese Title:	硅、锗单晶电阻率测定直排四探针法
Standard No.:	GB/T 1552-1995
Category No.:	H21
Issued by:	STSB
Issued on:	1995-04-18
Implemented on:	1995-1-2
Status:	superseded
Superseded by:	GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon
Superseded on:	2010-6-1
Abolished on:
Superseding:	GB 1552-1979 Measurement of resistivity for monocrystalline silicon with D-C four point probe GB 5251-1985 Germanium monocrystal--Examination of resistivity--DC linear four-point probe GB 6615-1986 Standard method for resistivity of silicon slices with collinear four-probe array measuring
Word Count:	8000 words
Similar Standards:	GB/T 6618-1995 GB/T 8364-2003 GB/T 6522-1986 GB/T 4108-2004 GB/T 6608-1999 GB 1552-1979 GB/T 21115-2007 GB/T 4107-2004 GB 5251-1985 GB/T 3248-1982 GB/T 43315-2023 GB/T 43313-2023 GB/T 43096-2023 GB/T 43092-2023 GB/T 23365-2023 GB/T 43093-2023 GB/T 42902-2023 GB/T 1555-2023 GB/T 42676-2023 GB/T 42905-2023

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