Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay GB/T 1553-1997 - Chinese Category:GB/T 1553-1997

English Title:	Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
Chinese Title:	硅和锗体内少数载流子寿命测定光电导衰减法
Standard No.:	GB/T 1553-1997
Category No.:	H21
Issued by:	SBTS
Issued on:	1997-06-03
Implemented on:	1997-1-2
Status:	abolished
Superseded by:	GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
Superseded on:	2010-6-1
Abolished on:	2010-06-01
Superseding:	GB 1553-1979 Measurement of monocrystalline silicon lifetime by D. C photoconductive decay methods GB 5257-1985 Germanium single crystals--Measurement of minority carrier lifetime--DC photo conductive decay method
Word Count:	8000 words
Similar Standards:	GB/T 6618-1995 GB/T 8364-2003 GB/T 6522-1986 GB/T 4108-2004 GB/T 6608-1999 GB 1552-1979 GB/T 21115-2007 GB/T 4107-2004 GB 5251-1985 GB/T 3248-1982 GB/T 43315-2023 GB/T 43313-2023 GB/T 43096-2023 GB/T 43092-2023 GB/T 23365-2023 GB/T 43093-2023 GB/T 42902-2023 GB/T 1555-2023 GB/T 42676-2023 GB/T 42905-2023

Back Detail

Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886