Code of China Chinese Classification Professional Classification ICS Classification Latest Value-added Services

Chinese National Standard Category: Semimetal and semiconductor material analysis method

English Title: Standard test methods for measuring site flatness on silicon wafers by noncontact scanning
Chinese Title: 硅片局部平整度非接触式标准测试方法
Standard No.: GB/T 19922-2005
Category No.: H17
Issued by: AQSIQ,SAC
Issued on: 2005-9-19
Implemented on: 2006-4-1
Status: valid
Superseded by:
Superseded on:
Abolished on:
Superseding:
Word Count:5000 words
Similar Standards: GB/T 1558-2023   GB/T 35306-2023   GB/T 24582-2023   GB/T 42263-2022   GB/T 42276-2022   GB/T 42274-2022   GB/T 24581-2022   GB/T 41153-2021   GB/T 39145-2020   GB/T 39144-2020   GB/T 38976-2020   GB/T 37385-2019   GB/T 37211.2-2018   GB/T 37211.1-2018   GB/T 4059-2018   GB/T 1557-2018   GB/T 4060-2018   GB/T 37049-2018   GB/T 35309-2017   GB/T 35306-2017  
Back          Detail

Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886
Copyright: Foryou Tech Co., Ltd. 2008-2020