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Chinese National Standard Category: Semimetal and semiconductor material in general

English Title: Test method for determination of crystal defect density in PV silicon ingot and wafer
Chinese Title: 太阳能级多晶硅锭、硅片晶体缺陷密度测定方法
Standard No.: GB/T 37051-2018
Category No.: H80
Issued by:
Issued on: 2018-12-28
Implemented on:
Status: valid
Superseded by:
Superseded on:
Abolished on:
Superseding:
Word Count:5500 words
Similar Standards: GB/T 37051-2018   GB/T 29507-2013   GB/T 29057-2023   GB/T 16596-2019   GB/T 16595-2019   GB/T 14844-2018   GB/T 8756-2018   GB/T 34479-2017   GB/T 32279-2015   YS/T 985-2014   GB/T 30453-2013   GB/T 14863-2013   GB/T 30110-2013   GB/T 29505-2013   GB/T 29057-2012   YS/T 838-2012   GB/T 26069-2010   GB/T 26071-2010   GB/T 26068-2010   GB/T 14847-2010  
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