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Chinese National Standard Category: Semiconductor discrete devices in general

English Title: Mechanical and climatic test methods for semiconductor devices
Chinese Title: 半导体器件机械和气候试验方法
Standard No.: GB/T 4937-1995
Category No.: L40
Issued by: STSB
Issued on: 1995-01-02
Implemented on: 1996-8-1
Status: superseded
Superseded by:GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure
GB/T 4937.1-2006 Semiconductor devices - Mechanical and climatic test methods - Part 1 : General
Superseded on:2007-2-1
Abolished on:
Superseding:GB 4937-1986
GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure
GB 4937-1985 Mechanical and climatic test methods for discrete semiconductor devices
Word Count:16000 words
Similar Standards: T/CIE 145-2022   T/CIE 116-2021   T/CIE 147-2022   T/CIE 119-2021   GB/T 4937.26-2023   GB/T 4587-2023   GB/T 42709.19-2023   GB/T 4937.42-2023   GB/T 4937.27-2023   GB/T 42709.7-2023   GB/T 4937.32-2023   GB/T 4937.31-2023   GB/T 4937.23-2023   GB/T 42706.5-2023   GB/T 42706.2-2023   GB/T 42709.5-2023   GB/T 4937.17-2018   GB/T 4937.30-2018   GB/T 4937.14-2018   GB/T 4937.15-2018  
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