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Chinese National Standard Category: Semiconductor emitting device

English Title: Methods of Measurement for Semiconductor Infrared Diodes - General Rules
Chinese Title: 半导体红外发光二极管测试方法 总则
Standard No.: SJ 2658.1-1986
Category No.: L53
Issued by:
Issued on:
Implemented on: 1986-10-1
Status: superseded
Superseded by:SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode. Part 1: General
Superseded on:2016-4-1
Abolished on:2016-04-01
Superseding:
Word Count:1000 words
Similar Standards: T/CIE 093-2020   T/CIRA 9-2020   GB/T 15651.6-2023   GB/T 43590.102-2023   GB/T 20871.63-2021   GB/T 18910.201-2021   GB/T 18910.202-2021   GB/T 18910.203-2021   GB/T 18910.102-2021   GB/T 18910.61-2021   GB/T 39771.1-2021   GB/T 39771.2-2021   GB/T 36359-2018   GB/T 36356-2018   GB/T 36360-2018   GB/T 36357-2018   JB/T 10875-2008   SJ 53930/1-2002   GB 9492-1988   GB 9493-1988  
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