 |
Chinese Classification
Professional Classification
ICS Classification
Latest
Value-added Services
|
| Chinese National Standard Category: Semiconductor emitting device |
| English Title: | Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Capacitance |
| Chinese Title: | 半导体红外发光二极管测试方法 电容的测试方法 |
| Standard No.: | SJ 2658.4-1986 |
| Category No.: | L53 |
| Issued by: | |
| Issued on: | |
| Implemented on: | 1986-10-1 |
| Status: | superseded |
| Superseded by: | SJ/T 2658.4-2015 Measuring method for semiconductor infrared-emitting diode. Part 4: Total capacitance |
| Superseded on: | 2016-4-1 |
| Abolished on: | |
| Superseding: | |
| Word Count: | 2000 words |
| Similar Standards: |
| Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886 |
| Copyright: Foryou Tech Co., Ltd. 2008-2020 |