2024-11-22 18.119.141.115
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
DL/T 2343.1-2021 Technical specification for components used in electrical energy metering equipments-Part 1: General 330.0 via email in 1~3 business day valid,,2022-3-22
DL/T 2343.2-2021 Technical specification for components used in electrical energy metering equipments 一 Part 2: Liquid crystal display device 330.0 via email in 1~3 business day valid,,2022-3-22
GB 11113-1989 method for impruities in the synthetic quartz crystal 45.0 via email in 1~3 business day abolished2017-12-15,,1990-3-1
GB 11114-1989 for detecting dislocations of synthetic quartz crystal using X-ray topographic technique 60.0 via email in 1~3 business day abolished2017-12-15 ,,1990-3-1
GB 11296-1989 Designations for infrared detecting materials 30.0 via email in 1~3 business day valid,,1990-1-1
GB 11297.10-1989 Test method for Curie temperature of pyroelectric materials 45.0 via email in 1~3 business day abolished2016-07-01,2016-7-1,1990-1-1
GB 11297.11-1989 Test method for the dielectric constant of Pyroelectric materials 30.0 via email in 1~3 business day abolished2016-07-01,2016-7-1,1990-1-1
GB 11297.12-1989 Test method for extinction ratio of LN, kDP and kDP electrooptic crystal 30.0 via email in 1~3 business day abolished2013-06-01,2013-6-1,1990-1-1
GB 1772-1979 Determination of failure rate of electronic elements and components via email in business day abolished2005-10-14,,1980-3-1
GB 2689.1-1981 Constant stress life tests and acceleration life tests;General rules 150.0 via email in 1~3 business day valid,,1981-10-1
GB 2689.2-1981 Life test and acceleration life test charts-Evaluation of their Weibull distributions 90.0 via email in 1~3 business day valid,,1981-10-1
GB 2689.3-1981 Life test and acceleration life test;Simple linear deflection-free evaluation of Weibull distributions 90.0 via email in 1~3 business day valid,,1981-10-1
GB 2689.4-1981 Life test and acceleration life test;Optimal linear deflection-free evaluation of Weibull distributions 90.0 via email in 1~3 business day valid,,1981-10-1
GB 4965-1985 Classification and designation for getter 60.0 via email in 1~3 business day valid,,1985-1-1
GB 50678-2011 Code for design of the waste electrical and electronic equipment processing engineering 1140.0 via email in 1~10 business day valid,,2012-8-1
GB 5076-1985 Measurement of the dimensions of a cylindrical component having two axial terminations 30.0 via email in 1~3 business day valid,,1985-12-1
GB 5078-1985 Method for the determination of the space required by capacitors and resistors with unidirectional terminations 45.0 via email in 1~3 business day valid,,1985-12-1
GB 50781-2012 Technical code for Chemical System of Electronic Factory 130.0 via email in 1 business day valid,,2012-12-1
GB 5081-1985 Guide for the collection of reliability, availability and maintainability data from field performance of electronic items 45.0 via email in 1~3 business day valid,,1986-1-1
GB 5839-1986 Rating systems for electronic tubes and semiconductor devise 30.0 via email in 1~3 business day valid,,1986-12-1
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DL/T 2343.1-2021 Technical specification for components used in electrical energy metering equipments-Part 1: General 
  Issued on: 2021-12-22   Price(USD): 330.0
DL/T 2343.2-2021 Technical specification for components used in electrical energy metering equipments 一 Part 2: Liquid crystal display device 
  Issued on: 2021-12-22   Price(USD): 330.0
GB 11113-1989 method for impruities in the synthetic quartz crystal 
  Issued on: 1989-3-22   Price(USD): 45.0
GB 11114-1989 for detecting dislocations of synthetic quartz crystal using X-ray topographic technique 
  Issued on: 1989-3-22   Price(USD): 60.0
GB 11296-1989 Designations for infrared detecting materials 
  Issued on: 1988-10-9   Price(USD): 30.0
GB 11297.10-1989 Test method for Curie temperature of pyroelectric materials 
  Issued on: 1988-10-9   Price(USD): 45.0
GB 11297.11-1989 Test method for the dielectric constant of Pyroelectric materials 
  Issued on: 1989-3-31   Price(USD): 30.0
GB 11297.12-1989 Test method for extinction ratio of LN, kDP and kDP electrooptic crystal 
  Issued on: 1988-10-9   Price(USD): 30.0
GB 1772-1979 Determination of failure rate of electronic elements and components 
  Issued on: 1979-09-25   Price(USD):
GB 2689.1-1981 Constant stress life tests and acceleration life tests;General rules 
  Issued on: 1981-6-22   Price(USD): 150.0
GB 2689.2-1981 Life test and acceleration life test charts-Evaluation of their Weibull distributions 
  Issued on: 1981-6-22   Price(USD): 90.0
GB 2689.3-1981 Life test and acceleration life test;Simple linear deflection-free evaluation of Weibull distributions 
  Issued on: 1981-6-22   Price(USD): 90.0
GB 2689.4-1981 Life test and acceleration life test;Optimal linear deflection-free evaluation of Weibull distributions 
  Issued on: 1981-6-22   Price(USD): 90.0
GB 4965-1985 Classification and designation for getter 
  Issued on: 1985-2-28   Price(USD): 60.0
GB 50678-2011 Code for design of the waste electrical and electronic equipment processing engineering 
  Issued on: 2011-09-16   Price(USD): 1140.0
GB 5076-1985 Measurement of the dimensions of a cylindrical component having two axial terminations 
  Issued on: 1985-4-16   Price(USD): 30.0
GB 5078-1985 Method for the determination of the space required by capacitors and resistors with unidirectional terminations 
  Issued on: 1985-04-16   Price(USD): 45.0
GB 50781-2012 Technical code for Chemical System of Electronic Factory 
  Issued on: 2012-06-28   Price(USD): 130.0
GB 5081-1985 Guide for the collection of reliability, availability and maintainability data from field performance of electronic items 
  Issued on: 1985-4-17   Price(USD): 45.0
GB 5839-1986 Rating systems for electronic tubes and semiconductor devise 
  Issued on: 1986-01-29   Price(USD): 30.0
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