| Title |
Standard No. |
Implemented On |
| General requirements of safety testing-inspecting report of in-service equipment and facilities for metal and nonmetal mines | AQ/T 2074-2019 | 2020-2-1 |
| General technical requirements for impurities control of commercial coal | GB/T 31087-2014 | 2015-6-1 |
| Geological data concurrent specification | DZ/T 0273-2015 | 2015-4-1 |
| Inspection and evaluation of quality for geological data | DZ/T 0268-2014 | 2014-12-30 |
| Energy consumption quota in producing antimony concentrate | YS/T 767-2012 | 2012-11-1 |
| The energy consumption of zinc and lead mine for mining and processing | YS/T 748-2010 | 2011-3-1 |
| The norm of energy consumption for producing nickel concentrate | YS/T 708-2009 | 2010-6-1 |
| The norm of energy consumption for producing tin concentrate | YS/T 709-2009 | 2010-6-1 |
| The norm of energy consumption for producing copper concentrate | YS/T 693-2009 | 2010-6-1 |
| General rules for the sampling and sample preparation of minerals in bulk - Experimental methods for checking the precision and bias | GB/T 2007.4-2008 | 2009-4-1 |
| Specifications for Compilation of Geological Report of Solid Miner | DZ/T 0033-2002 | 2003-3-1 |
| Limits and methods of measurement of interference characteristics of television games | SJ 11151-1997 | 1998-5-1 |
| Specification of information exchange format for character generators | SJ/T 11172-1998 | 1998-5-1 |
| Generic specification for optical mark reader | SJ/T 11115-1997 | 1998-1-1 |
| Speech database specification of putonghua for computer | SJ/T 11143-1997 | 1998-1-1 |
| Terminology for Mineral Processing of Non-ferrous Metals | YS/T 5028-1995 | 1997-5-1 |
| Ribbon cassettes used in serial matrix printers | SJ/T 10762-1996 | 1997-1-1 |
| Series of dimensions of terminals for vacuum capacitors | SJ/T 11092-1996 | 1997-1-1 |
| Variable ceramic vacuum capacitors for Type CKTB 400/7.5/60 | SJ/T 10889-1996 | 1997-1-1 |
| Information processing-Spools of printing ribbons for office machines and printing maching | SJ/T 10764-1996 | 1997-1-1 |
| Series of turning numbers for variable vacuum capacitors | SJ/T 11093-1996 | 1997-1-1 |
| Terminology for plastitc working of non-ferrous metasls | YS/T 5027-1995 | 1996-4-1 |
| Terminology standards for extractive metallurgy of light metals | YS/T 5026-1995 | 1996-4-1 |
| Structure type and dimensions for film dielectric tuning variable capacitors | SJ/T 10648-1995 | 1995-10-1 |
| Terminoiogy for mining of metal mines | YS/T 5022-1994 | 1995-6-1 |
| Reliability requirement and testing methods for loudspeakers | SJ/T 10601-1994 | 1995-4-1 |
| Manufacture time quata for geological instrument meter - painting | DZ/T 0101.11-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - electrodeposition | DZ/T 0101.10-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - planing machine | DZ/T 0101.3-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - ramming | DZ/T 0101.8-1994 | 1994-12-1 |
| Testability bus -Part 1:Standard test access port and boundary scan architecture | SJ/T 10566-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - truning machine | DZ/T 0101.1-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - bench worker | DZ/T 0101.5-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - metal plate | DZ/T 0101.7-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - cast of nonferrous metal | DZ/T 0101.9-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - printed plate | DZ/T 0101.12-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - drilling machine | DZ/T 0101.6-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - assembly | DZ/T 0101.13-1994 | 1994-12-1 |
| Manufacture time quata for geological instrument meter - milling machine | DZ/T 0101.2-1994 | 1994-12-1 |
| Generic specification for plastic film dielectric pre-set variable capacitors | SJ/T 10507-1994 | 1994-10-1 |
| Generic specification for ceramic dielectric pre-set variable capacitors in electronic equipment | SJ/T 10510-1994 | 1994-10-1 |
| Detail specification for tubular-style ceramic dielectric pre-set variable capacitors Model CCW5 | SJ/T 10512-1994 | 1994-10-1 |
| Detail specification for plastic film dielectric pre-set variable capacitors Model CYM2 | SJ/T 10509-1994 | 1994-10-1 |
| Detail specification for plastic film dielectric pre-set variable capacitors Model CYM1 | SJ/T 10508-1994 | 1994-10-1 |
| Compliance test method of reliability target for electronic industry special equipment | SJ/T 10386-1993 | 1994-1-1 |
| Reliability terminology for electronic industry special equipment | SJ/T 10388-1993 | 1994-1-1 |
| Electronic organ-Quality grading standard | SJ/T 9525-1993 | 1993-11-1 |
| Development and design guide for office automation system | SJ/T 10352-1993 | 1993-10-1 |
| Generic specification for household electronic game machine | SJ/T 10360-1993 | 1993-10-1 |
| Capacitors,fixed, electrolytic (aluminum oxide), established reliability, Style CDK11,Detail specification for | SJ 20205-1992 | 1993-5-1 |
| Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CCK102 | SJ 20190-1992 | 1993-5-1 |
| Capacitors,electrolytic(solid electrolyte),Tantalum (Polarized sintered slug) Type CA420,Detail specification for | SJ 20210-1992 | 1993-5-1 |
| Semiconductor discrete device - Detail specification for NPN silicon low-power high-reverse-voltage transistor of Types 3DG3439 and 3DG3440 | SJ 20176-1992 | 1993-5-1 |
| Detaio specification for capacitors,electrolytic(non-solid electrolyte), Tantalum,Type CA300 | SJ 20209-1992 | 1993-5-1 |
| Semiconductor discrete device - Detail specification for NPN silicon ultra-high frequency low-power transistor of Type 3DG918 | SJ 20175-1992 | 1993-5-1 |
| Detail specification for capacitors, fixed, mica dielectric, established reliability, Type CYK2 | SJ 20211-1992 | 1993-5-1 |
| Semiconductor discrete device - Detail specification for silicon rectifier diodes for Types 2CZ5550 through 2CZ5554 | SJ 20187-1992 | 1993-5-1 |
| Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CCK101 | SJ 20189-1992 | 1993-5-1 |
| ~ | SJ 20188-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for field-effect transistor of Types CS3821,3822,3823 | SJ 20184-1992 | 1993-5-1 |
| ~ | SJ 20185-1992 | 1993-5-1 |
| Detail specification capacitors,fixed, ceramic dielectric, established reliability, Type CCK402 | SJ 20194-1992 | 1993-5-1 |
| Design guide for electromagnetic interference(EMI) reduction in power supplies | SJ 20156-1992 | 1993-5-1 |
| Detail specification for capacitors,Electrolytic (Solid eletrolyte),Tantalum, (nonpolarized, sintered slug), Established reliability,Type CAK70 | SJ 20208-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for reverse-blocking thyristor for Types 3CT682,683, 685～692 and 3CT5206 | SJ 20182-1992 | 1993-5-1 |
| Semiconductor discrete device - Detail specification for silicon voltage regulate diodes for Types 2CW2970 ~ 3015 | SJ 20186-1992 | 1993-5-1 |
| Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability, Type CTK4101 | SJ 20203-1992 | 1993-5-1 |
| Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CCK405 | SJ 20197-1992 | 1993-5-1 |
| Detail specification capacitors,fixed, ceramic dielectric, established reliability, Type CCK404 | SJ 20196-1992 | 1993-5-1 |
| Electrostatic discharge susceptibility testing for information technology equipment | SJ 20154-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for reverse-blocking thyristor for Type 3CT103 | SJ 20179-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for NPN silicon low-power switching transistor of Types 3DK2221,3DK2221A, 3DK2222 and 3DK2222A | SJ 20174-1992 | 1993-5-1 |
| SJ 20177 -1992 Semiconductor discrete device - Detail specification for PNP silicon low-power switching transistor for Types 3CK3634 ~ 3CK3637 | SJ 20177 -1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for NPN silicon low-power switching transistor of Types 3DK2218,3DK2218A, 3DK2219 and 3DK2219A | SJ 20173-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for reverse-blocking thyristor for Type 3CT105 | SJ 20180-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for reverse-blocking thyristor for Type 3CT107 | SJ 20181-1992 | 1993-5-1 |
| Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CCK103 | SJ 20191-1992 | 1993-5-1 |
| Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CTK8112 | SJ 20204-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for Type 3CK38 power switching transistor | SJ 20178-1992 | 1993-5-1 |
| Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CCK104 | SJ 20192-1992 | 1993-5-1 |
| Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CCK401 | SJ 20193-1992 | 1993-5-1 |
| Detail specification capacitors,fixed, ceramic dielectric, established reliability, Type CCK403 | SJ 20195-1992 | 1993-5-1 |
| Semiconductor discrete device-Detail specification for Type 3DD6 power transistor | SJ 20183-1992 | 1993-5-1 |
| Detail specification capacitors,fixed, ceramic dielectric, established reliability, Type CCK406 | SJ 20198-1992 | 1993-5-1 |
| General specification for radio frequency radiation absorber(microwave absorbing material) | SJ 20155-1992 | 1993-5-1 |
| Capacitors, electrolytic (non-solid electrolyte),tantalum, (polarized, plainfoil), established reliability, Style CAK11, Detail specification for | SJ 20206-1992 | 1993-5-1 |
| AM/FM 4-section film dielectric variable tuning capacitors for Model CBM-443BF | SJ/T 10284-1991 | 1992-1-1 |
| Super-minicomputer TJ2220 | SJ/T 10198-1991 | 1991-12-1 |
| Specification for microcomputer Great Wall 0520A, C-H | SJ/T 10204-1991 | 1991-12-1 |
| Requirements and testing methods of high-temperature load reliability for electric tuners of TV broadcasting receivers | SJ/T 10292-1991 | 1991-12-1 |
| Specification for keyboard for Type HXP-4 | SJ/T 10118-1991 | 1991-7-1 |
| Functional calculator for Type CZ-1206 | SJ/T 10117-1991 | 1991-7-1 |
| Medium digital electronic computer for type HDS8060 | SJ/T 10115-1991 | 1991-7-1 |
| Reliability growth and management of colour television broadcasting receivers | SJ 3222-1989 | 1989-3-1 |
| Reliability test method for electronic equipment of satellite communications ground stations | SJ 2940-1988 | 1988-10-1 |
| Test methods for reliability of facsimile | SJ 2901-1988 | 1988-8-1 |
| Information processing - 3. 81mm wide magnetic tape cassette for information interchange recording at 4 cpmm, 63 ftprad phase encoded | SJ/Z 9087-1987 | 1987-11-27 |
| Data interchange - Structure for the identification of organizations | SJ/Z 9090-1987 | 1987-11-27 |
| Binary floating-point arithmetic for microprocessor system | SJ/Z 9071-1987 | 1987-11-2 |
| Office machines and printing machines used for information processing-Widths of fabric printing ribbons exceeding 19mm | SJ/Z 9056-1987 | 1987-10-30 |
| Information processing - Magnetic disk for data storage devices - 107, 500 flux transitions per track, with OD of 266 and 356mm | SJ/Z 9046-1987 | 1987-10-22 |
| Information processing. Self-Loading cartridges for 12.7mm wide magnetic tape | SJ/Z 9049-1987 | 1987-10-22 |
| Information processing - Magnetic disk for data storage devices - 160, 000 flux transitions per track, with OD of 356mm | SJ/Z 9045-1987 | 1987-10-22 |
| Identification cards - Machine readable passports | SJ/Z 9024-1987 | 1987-10-20 |
| Identification cards-Physical characteristics | SJ/Z 9025-1987 | 1987-10-20 |
| Completeness and preparation of design documentation for digital computer systems | SJ 2716-1986 | 1987-10-1 |
| Variable FM/AM four-section film dielectric capacitors for Type CBM-403, 443BF | SJ 2704-1986 | 1986-10-1 |
| Qualification test and acception test for reliability of radar equipment | SJ 2584-1985 | 1986-10-1 |
| Variable four-section film dielectric capacitors for FM and AM applications for Type CBM-443DF | SJ 2703-1986 | 1986-10-1 |
| Reliability approval and acceptance tests for monochrome television receivers | SJ 2596-1985 | 1986-1-1 |
| Reliability test method for shipborne navigation radar | SJ 2586-1985 | 1986-1-1 |
| Specification for S-100 bus | SJ 2559-1984 | 1985-10-1 |
| General specification for minicomputer | SJ 2348-1983 | 1984-1-1 |
| Generic specification for magnetic drum memories | SJ 2349-1983 | 1984-1-1 |
| Variable dual-section film dielectric capacitors for Type CBM-202B | SJ 1041-1982 | 1983-1-1 |
| Methods of measurement for electronic counters | SJ 1458-1979 | 1979-10-1 |
| General specification for general purpose low and medium speed electronic counters | SJ 1457-1979 | 1979-10-1 |
| Methods of measurement for electronic counters | SJ 1458-79 | 1979-10-1 |
| General specification for general purpose low and medium speed electronic counters | SJ 1457-79 | 1979-10-1 |
| designation system for computer | SJ 152-1975 | 1976-2-1 |
| designation system for computer | SJ 152-75 | 1976-2-1 |
