2023-9-27 44.192.115.114
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Code of China
Chinese National Standard List: Basic standards and general methods

T/CIQA 7-2020 Rapid determination of the moisture content of ethanol—Microwave transmission method 
  Issued on: 2020-09-23   Price(USD): 165.0
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems 
  Issued on: 2023-08-06   Price(USD): 690.0
GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water 
  Issued on: 2023-03-17   Price(USD): 315.0
GB/T 6488-2022 Single-mode optical fibres for telecommunication—Part 7: Characteristics of a bending loss insensitive single-mode optical fibre 
  Issued on: 2022-10-12   Price(USD): 120.0
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary  
  Issued on: 2021-12-31   Price(USD): 585.0
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy 
  Issued on: 2021-12-31   Price(USD): 315.0
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films  
  Issued on: 2021-12-31   Price(USD): 270.0
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel 
  Issued on: 2021-12-31   Price(USD): 255.0
GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis  
  Issued on: 2021-12-31   Price(USD): 225.0
GB/T 41074-2021 Microbeam analysis―Method of specimen preparation for analysis of general powders using WDS and EDS 
  Issued on: 2021-12-31   Price(USD): 225.0
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis 
  Issued on: 2021-12-31   Price(USD): 315.0
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary 
  Issued on: 2021-08-20   Price(USD): 495.0
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon 
  Issued on: 2021-05-21   Price(USD): 250.0
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer 
  Issued on: 2021-05-21   Price(USD): 255.0
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 
  Issued on: 2021-05-21   Price(USD): 450.0
GB/T 40244-2021 Chemicals - Liquid or solid identification - Fluidity test method 
  Issued on: 2021-05-21   Price(USD): 100.0
GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets 
  Issued on: 2021-05-21   Price(USD): 315.0
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)  
  Issued on: 2021-05-21   Price(USD): 255.0
GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy 
  Issued on: 2018-07-13   Price(USD): 220.0
GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy 
  Issued on: 2018-07-13   Price(USD): 160.0
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