2022-12-2 34.229.119.176
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Code of China
Chinese National Standard List: Basic standards and general methods

T/CIQA 7-2020 Rapid determination of the moisture content of ethanol—Microwave transmission method 
  Issued on: 2020-09-23   Price(USD): 165.0
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary  
  Issued on: 2021-12-31   Price(USD): 585.0
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy 
  Issued on: 2021-12-31   Price(USD): 315.0
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films  
  Issued on: 2021-12-31   Price(USD): 270.0
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel 
  Issued on: 2021-12-31   Price(USD): 255.0
GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis  
  Issued on: 2021-12-31   Price(USD): 225.0
GB/T 41074-2021 Microbeam analysis―Method of specimen preparation for analysis of general powders using WDS and EDS 
  Issued on: 2021-12-31   Price(USD): 225.0
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis 
  Issued on: 2021-12-31   Price(USD): 315.0
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary 
  Issued on: 2021-08-20   Price(USD): 495.0
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon 
  Issued on: 2021-05-21   Price(USD): 250.0
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer 
  Issued on: 2021-05-21   Price(USD): 255.0
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 
  Issued on: 2021-05-21   Price(USD): 450.0
GB/T 40244-2021 Chemicals - Liquid or solid identification - Fluidity test method 
  Issued on: 2021-05-21   Price(USD): 100.0
GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets 
  Issued on: 2021-05-21   Price(USD): 315.0
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)  
  Issued on: 2021-05-21   Price(USD): 255.0
GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy 
  Issued on: 2018-07-13   Price(USD): 220.0
GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy 
  Issued on: 2018-07-13   Price(USD): 160.0
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis 
  Issued on: 2018-06-07   Price(USD): 610.0
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy 
  Issued on: 2018-05-14   Price(USD): 250.0
GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air 
  Issued on: 2018-05-14   Price(USD): 250.0
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