2024-12-22 18.217.72.114
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Code of China
Chinese National Standard List: Metal physical property test method

GB 1552-1979 Measurement of resistivity for monocrystalline silicon with D-C four point probe 
  Issued on:   Price(USD): 184.0
GB 5251-1985 Germanium monocrystal--Examination of resistivity--DC linear four-point probe 
  Issued on:   Price(USD): 180.0
GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers - Total reflection X-Ray fluorescence spectroscopy 
  Issued on: 2024-11-27   Price(USD): 315.0
GB/T 43894.1-2024 Practice for determining semiconductor wafer near-edge geometry—Part 1:Measured height data array using a curvature metric（ZDD） 
  Issued on: 2024-4-25   Price(USD): 195.0
GB/T 43315-2023 Test method for flow pattern defects in silicon wafer—Etching technique 
  Issued on: 2023-11-27   Price(USD): 195.0
GB/T 43313-2023 Test method for surface quality and micropipe density of polished silicon carbide wafers—Confocal and differential interferometry optics 
  Issued on: 2023-11-27   Price(USD): 195.0
GB/T 43096-2023 Metallic powders—Determination of envelope-specific surface area from measurements of the permeability to air of a powder bed under steady-state flow conditions  
  Issued on: 2023-09-07   Price(USD): 400.0
GB/T 43092-2023 Electrochemical performance test of lithium ion battery cathode materials—Test method for high temperature performance  
  Issued on: 2023-09-07   Price(USD): 320.0
GB/T 23365-2023 Electrochemical performance test of lithium cobalt oxide—Test method for the initial discharge specific capacity and the initial efficiency 
  Issued on: 2023-9-7   Price(USD): 160.0
GB/T 43093-2023 Electrochemical performance test of lithium nickel manganese oxide—Test method for the initial discharge specfic capacity and initial efficiency  
  Issued on: 2023-09-07   Price(USD): 240.0
GB/T 42902-2023 Test method for surface defects on silicon carbide epitaxial wafers―Laser scattering method 
  Issued on: 2023-08-06   Price(USD): 255.0
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal 
  Issued on: 2023-08-06   Price(USD): 170.0
GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method 
  Issued on: 2023-08-06   Price(USD): 165.0
GB/T 42905-2023 Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method 
  Issued on: 2023-08-06   Price(USD): 165.0
GB/T 42789-2023 Test method for gloss of silicon wafer 
  Issued on: 2023-08-06   Price(USD): 165.0
GB/T 42907-2023 Test method for excess-charge-carrier recombination lifetime in silicon ingots,silicon bricks and silicon wafers―Noncontact eddy-current sensor 
  Issued on: 2023-08-06   Price(USD): 255.0
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge 
  Issued on: 2023-08-06   Price(USD): 225.0
GB/T 1553-2023 Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method 
  Issued on: 2023-08-06   Price(USD): 465.0
GB/T 42514-2023 Corrosion evaluation for anodic oxide coatings and organic polymer coatings on aluminium and its alloys—Chart method  
  Issued on: 2023-05-23   Price(USD): 315.0
GB/T 42544-2023 Corrosion evaluation for anodic oxide coatings and organic polymer coatings on aluminium and its alloys—Grid method  
  Issued on: 2023-05-23   Price(USD): 105.0
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