2025-11-13 18.97.9.174
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Chinese National Standard List: Metal physical property test method

GB/T 46227-2025 Test method for transmittance of semiconductor single crystal materials 
  Issued on: 2025-8-29   Translation Price(USD): 210.0
GB/T 20831-2025 Method of test for the thermal endurance of surface insulation coatings of electrical sheet and strip 
  Issued on: 2025-8-29   Translation Price(USD): 270.0
GB/T 5161-2025 Metallic powder—Determination of effective density—Liquid immersion method 
  Issued on: 2025-8-29   Translation Price(USD): 270.0
GB/T 19444-2025 Test method for oxygen precipition characteristics of silicon wafers—Interstitial oxygen reduction 
  Issued on: 2025-06-30   Translation Price(USD): 210.0
GB/T 6148-2025 Test method for temperature-resistance coefficient of precision resistance alloys 
  Issued on: 2025-04-25   Translation Price(USD): 210.0
GB/T 6147-2025 Test method for thermoelectric power of precision resistance alloys 
  Issued on: 2025-04-25   Translation Price(USD): 210.0
GB/T 41079.3-2024 Test methods for physical properties of liquid metals—Part 3: Determination of viscosity 
  Issued on: 2024-10-26   Translation Price(USD): 210.0
GB/T 44558-2024 Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy 
  Issued on: 2024-09-29   Translation Price(USD): 270.0
GB/T 44330-2024 Lithium-ion battery cathode materials—Determination of powder compaction density 
  Issued on: 2024-8-23   Translation Price(USD): 210.0
GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers - Total reflection X-Ray fluorescence spectroscopy 
  Issued on: 2024-11-27   Translation Price(USD): 315.0
GB/T 43894.1-2024 Practice for determining semiconductor wafer near-edge geometry—Part 1:Measured height data array using a curvature metric（ZDD） 
  Issued on: 2024-4-25   Translation Price(USD): 195.0
GB/T 43315-2023 Test method for flow pattern defects in silicon wafer—Etching technique 
  Issued on: 2023-11-27   Translation Price(USD): 195.0
GB/T 43313-2023 Test method for surface quality and micropipe density of polished silicon carbide wafers—Confocal and differential interferometry optics 
  Issued on: 2023-11-27   Translation Price(USD): 195.0
GB/T 23365-2023 Electrochemical performance test of lithium cobalt oxide—Test method for the initial discharge specific capacity and the initial efficiency 
  Issued on: 2023-9-7   Translation Price(USD): 160.0
GB/T 43092-2023 Electrochemical performance test of lithium ion battery cathode materials—Test method for high temperature performance  
  Issued on: 2023-09-07   Translation Price(USD): 320.0
GB/T 43093-2023 Electrochemical performance test of lithium nickel manganese oxide—Test method for the initial discharge specfic capacity and initial efficiency  
  Issued on: 2023-09-07   Translation Price(USD): 240.0
GB/T 43096-2023 Metallic powders—Determination of envelope-specific surface area from measurements of the permeability to air of a powder bed under steady-state flow conditions  
  Issued on: 2023-09-07   Translation Price(USD): 400.0
GB/T 42907-2023 Test method for excess-charge-carrier recombination lifetime in silicon ingots,silicon bricks and silicon wafers―Noncontact eddy-current sensor 
  Issued on: 2023-08-06   Translation Price(USD): 255.0
GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method 
  Issued on: 2023-08-06   Translation Price(USD): 165.0
GB/T 42902-2023 Test method for surface defects on silicon carbide epitaxial wafers―Laser scattering method 
  Issued on: 2023-08-06   Translation Price(USD): 255.0
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