Code of China Chinese Classification Professional Classification ICS Classification Latest Value-added Services

Chinese National Standard List: Optoelectronic device assembly

Title Standard No. Implemented On
Laser-induced breakdown spectroscopyGB/T 38257-20192020-7-1
Test method for optical axis parallelism of multiple optical pathsGB/T 38256-20192020-7-1
Test method of colourless optical glass—Part 23:Resistance to climaticGB/T 7962.23-20192020-3-1
Test method of colourless optical glass—Part 22:Resistance to attack by aqueous alkaline phosphate-containingGB/T 7962.22-20192020-3-1
Test methods for microchannel plateGB/T 37951-20192020-3-1
Test method of colourless optical glass—Part 21:Resistance to attack by aqueous alkaline solutionsGB/T 7962.21-20192020-3-1
Organic light-emitting diode(DLED)lighting-Terminology and letter symbols GB/T 36919-20192019-10-1
Semiconductor lighting terminologyGB/T 37031-20182018-12-28
Semiconductor lighting terminologySJ/T 11395-20092010-1-1
general specification for bulk acoustoptic deviceSJ 20986-20082008-6-30
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 3-28:Examinations and measurements—Transient lossGB/T 18311.28-20072007-11-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 3-30:Examinations and measurements—Polish angle and fibre position on single feGB/T 18311.30-20072007-11-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 3-31:Examinations and measurements—Coupled power ratio measurement for fibre opGB/T 18311.31-20072007-11-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 3-20:Examinations and measurements—Directivity of fibre optic branching devicesGB/T 18311.20-20072007-11-1
Fibre optic connector interfaces—Part 1:General and guidanceGB/T 21022.1-20072007-11-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 3-16:Examinations and measurements—Endface radius of spherically polished ferruGB/T 18311.16-20072007-11-1
Fibre optic interconnecting devices and passive components—Basic test and measurements procedures—Part 3-26:Examinations and measurements—Measurement of the angular misalignment betGB/T 18311.26-20072007-11-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 2-48:Tests—Temperature-humidity cyclingGB/T 18310.48-20072007-11-1
Fibre optic interconnecting devices and passive components—Basic test and measurement proceures—Part 3-34:Examinations and measurements—Attenuation of random mated connectorsGB/T 18311.34-20032004-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-14: Tests - Maximum input powerGB/T 18310.14-20032004-8-1
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristicsGB/T 15651.2-20032004-8-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 2-9:Tests—ShockGB/T 18310.9-20032004-8-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 2-45:Tests—Durability test by water immersionGB/T 18310.45-20032004-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-42: Tests - Static side load for connectorsGB/T 18310.42-20032004-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-26: Test - Salt mistGB/T 18310.26-20032004-8-1
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methodsGB/T 15651.3-20032004-8-1
Fibre optic interconneting devices and passive components—Basic test and measurement procedures—Part 3-40:Examinations and measurements—Extinction ratio of a polarization maintaining(pm) fibre pigtailed connectorGB/T 18311.40-20032004-8-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 3-4:Examinations and measurements—AttenuationGB/T 18311.4-20032004-8-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 2-22:Tests—Change of temperatureGB/T 18310.22-20032004-8-1
Fibre optic interconnecting devices and passive components—Basic test and measurement procedures—Part 3-1:Examinations and measurements—Visual examinationGB/T 18311.1-20032004-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedure - Part 3-5: Examinations and measurements - Wavelength dependence of attenuationGB/T 18311.5-20032004-8-1
Fibre optic interconnecting devices and passive components-Basic test and measurement procedures Part 2-1: Tests-Vibration(sinusoidal)GB/T 18310.1-20022003-5-1
Fibre optic interconnecting devices and passive components--Basic test and meadurement procedures--Part 2-21:Test--Composite temperature-humidity cyclic testGB/T 18310.21-20022003-5-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-5: Tests - Torsion/twistGB/T 18310.5-20022003-5-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-12: Test - ImpactGB/T 18310.12-20022003-5-1
Fibre optic interconnecting devices and passive components-Basic test and measurement procedures Part 2-19: Tests-Damp heat(steady state)GB/T 18310.19-20022003-5-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Test - Damp heat(steady state)GB/T 19340.19-20022003-5-1
Semiconductor photoelectric assembly Detail specification for miniature duplex photoelectric localizer for type CBGS 2301SJ 20786/1-20022003-5-1
Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-18:Tests--Dry heat-High temperature enduranceGB/T 18310.18-20012001-8-1
Fibre optic interconnecting devices and passive components--Basic test and meaurement procedures--Part 2-3:Tests--Static shear loadGB/T 18310.3-20012001-8-1
Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 3-3: Examinations and measurements--Monitoring change in attenuation and in return loss (multiple paths)GB/T 18311.3-20012001-8-1
Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-39:Tests--Susceptibility to external magnetic fieldsGB/T 18310.39-20012001-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-6: Examinations and measurements - Return lossGB/T 18311.6-20012001-8-1
Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-2:Tests-Mating durabilityGB/T 18310.2-20012001-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-2: Examinations and measurements - Polarization dependence of a single - GB/T 18311.2-20012001-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 1: General and guidanceGB/T 18309.1-20012001-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-6: Tests - Tensile strength of coupling mechanismGB/T 18310.6-20012001-8-1
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests-Fibre/cable retentionGB/T 18310.4-20012001-8-1
fiber mechanical - Type splice insertion loss testGB/T 14137-19931993-8-1
Semiconductor devices Sectional specification for optoelectronic devicesGB/T 12565-19901991-10-1
About Us   |    Contact Us   |    Terms of Service   |    Privacy   |    Cancellation & Refund Policy   |    Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 Email: coc@codeofchina.com | Send me a messageQQ: 672269886
Copyright: TransForyou Co., Ltd. 2008-2020