2023-12-4 3.233.221.90
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Code of China
Chinese National Standard List: Special electronic technology material

T/CEMIA 028-2022 Specification for surface electrode paste for use in chip resistors 
  Issued on: 2022-02-14   Price(USD): 165.0
GB 9620.8-1988 Methods of analysis for silver-copper brazing for electronic devices--Determination of magnesium (spectrophotometric-atomic absorption method) 
  Issued on:   Price(USD): 180.0
GB/T 37275-2018 Test method for lasing threshold and slope efficiency of Nd: YAG laser rods 
  Issued on: 2018-12-28   Price(USD): 110.0
T/CEMIA 032-2022 Buffered oxide etchant for display panels 
  Issued on: 2022-04-20   Price(USD): 225.0
T/CEMIA 030-2022 Positive photoresist developer for semiconductor manufacture 
  Issued on: 2022-04-20   Price(USD): 225.0
GB 9620.7-1988 Methods of analysis for silver-copper brazing for electronic devices--Determination of iron,cadmium and zinc (spectrophotometric-atomic absorption method) 
  Issued on:   Price(USD): 180.0
T/CEMIA 027-2022 Specification for back electrode paste for use in chip resistors 
  Issued on: 2022-02-14   Price(USD): 165.0
T/CEMIA 026-2021  
  Issued on: 2021-12-24   Price(USD): 165.0
T/CEMIA 029-2022 Specification for MLCC superfine silver palladium alloy powder 
  Issued on: 2022-02-14   Price(USD): 105.0
GB 9622.8-1988 Test method for temperature (Tk-100) while volume resistivity of electronic glass is 100M&8.cm 
  Issued on:   Price(USD): 180.0
T/CEMIA 024-2021 Quartz crucible manufacturing practices for semiconductor monosilicon growth 
  Issued on: 2021-07-15   Price(USD): 165.0
T/CEMIA 021-2019 Specification for resistance paste for thick film integrated circuits 
  Issued on: 2019-09-25   Price(USD): 165.0
GB/T 9533-1988 Test method for the determination of the dielectric properties of solid dielectric materials at microwave frequencies-The method of coaxial terminal short circuit 
  Issued on: 1988-06-28   Price(USD): 260.0
GB/T 4184-2021 Tungsten-rhenium alloy wires  
  Issued on: 2021-12-31   Price(USD): 225.0
GB/T 37945-2019 Materials for organic light emitting diode display(OLED)—Test method of glass transfer temperature—Differential scanning calorimetry (DSC) 
  Issued on: 2019-08-30   Price(USD): 105.0
GB/T 37406-2019 Detection method of degree of sphericity of spherical silica for electronic packaging—Particle dynamic photoelectric projection method 
  Issued on: 2019-05-10   Price(USD): 80.0
GB/T 37946-2019 Test method of thermal stability of materials for organic light emitting diode display(OLED) 
  Issued on: 2019-08-30   Price(USD): 165.0
GB/T 37949-2019 Purity test method of small molecule materials applied in organic light emitting diode display(OLED)—High performance liquid chromatography (HPLC) 
  Issued on: 2019-08-30   Price(USD): 160.0
GB/T 37255-2018 Test method for pyroelectric coefficient of materials under DC bias field 
  Issued on: 2018-12-28   Price(USD): 105.0
GB/T 37082-2018 Specification for common mixture liquid crystal materials 
  Issued on: 2018-12-28   Price(USD): 160.0
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