Title |
Standard No. |
Implemented On |
Test method for lasing threshold and slope efficiency of Nd: YAG laser rods | GB/T 37275-2018 | |
Quartz crucible manufacturing practices for semiconductor monosilicon growth | T/CEMIA 024-2021 | |
Test method for the determination of the dielectric properties of solid dielectric materials at microwave frequencies-The method of coaxial terminal short circuit | GB/T 9533-1988 | |
Materials for organic light emitting diode display(OLED)—Test method of glass transfer temperature—Differential scanning calorimetry (DSC) | GB/T 37945-2019 | 2019-12-1 |
Detection method of degree of sphericity of spherical silica for electronic packaging—Particle dynamic photoelectric projection method | GB/T 37406-2019 | 2019-12-1 |
Test method of thermal stability of materials for organic light emitting diode display(OLED) | GB/T 37946-2019 | 2019-12-1 |
Purity test method of small molecule materials applied in organic light emitting diode display(OLED)—High performance liquid chromatography (HPLC) | GB/T 37949-2019 | 2019-12-1 |
Test method for pyroelectric coefficient of materials under DC bias field | GB/T 37255-2018 | 2019-11-1 |
Specification for common mixture liquid crystal materials | GB/T 37082-2018 | 2019-7-1 |
Nanoscale barium titanate | GB/T 36595-2018 | 2019-6-1 |
Test method for cross-linking degree of ethylene-vinyl acetate copolymer applied in photovoltaic modules. Differential scanning calorimetry(DSC) | GB/T 36965-2018 | 2019-4-1 |
Test method of flat panel display(FPD)color filters—Part 5:Contrast ratio | GB/T 31370.5-2018 | 2019-4-1 |
Ethylene--vinyl acetate copolymer (EVA) film for PV module | GB/T 29848-2018 | 2019-4-1 |
Specification for liquid crystal monomers | GB/T 36647-2018 | 2019-4-1 |
Specification for TFT liquid crystal monomers | GB/T 36648-2018 | 2019-4-1 |
Test method for alpha crystalline silicon dioxide content of spherical silica powder for electronic packaging—XRD method | GB/T 36655-2018 | 2019-1-1 |
Test method for surface scratch resistance of flat panel display(FPD)polarizing film | GB/T 36952-2018 | 2018-12-28 |
General technical requirements for electromagnetic shielding film | GB/T 35575-2017 | 2018-7-1 |
Getter terms | GB/T 4314-2017 | 2018-7-1 |
Tungsten wires | GB/T 4181-2017 | 2018-2-1 |
Creep testing,high temperature treatment and metallographic examination of the tungsten wire | GB/T 4194-2017 | 2018-2-1 |
Tungsten bars and rods | GB/T 4187-2017 | 2018-2-1 |
Molybdenum bars and molybdenum rods | GB/T 4188-2017 | 2018-2-1 |
Molybdenum-tungsten alloy bars and rods | GB/T 4185-2017 | 2018-2-1 |
Test method for wavefront distortion of laser rods | GB/T 11297.1-2017 | 2017-12-1 |
Neodymium-doped Yttrium Aluminum Garnet laser rods | GB/T 13842-2017 | 2017-12-1 |
Test method for dielectric tangent of loss angle of pyroelectric materials | GB/T 11297.9-2015 | 2016-7-1 |
Test method for dielectric constant of pyroelectric materials | GB/T 11297.11-2015 | 2016-7-1 |
Test method for curie temperature of pyroelectric materials | GB/T 11297.10-2015 | 2016-7-1 |
Test method for pyroelectric coefficient of pyroelectric materials | GB/T 11297.8-2015 | 2016-7-1 |
Test method for determining the content of vinyl acetate in ethylene-vinyl acetatecopolymer applied in photovoltaic modules―Thermal gravimetric analysis(TGA) | GB/T 31984-2015 | 2016-5-1 |
Tin-coated copper ribbon for photovoltaic application | GB/T 31985-2015 | 2016-5-1 |
Phosphors―Part 2:Types | GB/T 5838.2-2015 | 2016-1-1 |
Phosphors―Part 1:Terminology | GB/T 5838.1-2015 | 2016-1-1 |
Phosphors for plasma display panel | GB/T 31417-2015 | 2016-1-1 |
Test methods for properties of structure ceramicused in electronic components and device―Part 3:Test method for mean coefficient of linear expansion | GB/T 5594.3-2015 | 2016-1-1 |
Test methods for properties of structure ceramicused in electronic components and device―Part 7:Test method for liquid permeability | GB/T 5594.7-2015 | 2016-1-1 |
Phosphors―Part 4-5:Phosphor for color display tubes | GB/T 5838.45-2015 | 2016-1-1 |
Test method for thermal conductivity of beryllium oxide ceramics | GB/T 5598-2015 | 2016-1-1 |
Phosphors―Part 4-3:Phosphors for oscilloscope tubes and display tubes | GB/T 5838.43-2015 | 2016-1-1 |
Semiconductor materials cutting fluid | GB/T 31469-2015 | 2016-1-1 |
Test methods for properties of structure ceramic used in electronic components and device―Part 8:Test method for microstructure | GB/T 5594.8-2015 | 2016-1-1 |
Phosphors―Part 3:Test methods for properties | GB/T 5838.3-2015 | 2016-1-1 |
Structure ceramic materials used in electronic component and device | GB/T 5593-2015 | 2016-1-1 |
Phosphors―Part 4-4:Phosphor for color picture tubes | GB/T 5838.44-2015 | 2016-1-1 |
Test methods for properties of structure ceramics used in electronic component and device―Part 6:Test method for chemical durability | GB/T 5594.6-2015 | 2016-1-1 |
Phosphors―Part 4-1:Phosphor for black-white picture tubes | GB/T 5838.41-2015 | 2016-1-1 |
Phosphors―Part 4-2:Phosphor for indicator tubes | GB/T 5838.42-2015 | 2016-1-1 |
Test method of flat panel display(FPD)color filters―Part 3:Heat resistance | GB/T 31370.3-2015 | 2015-10-1 |
Test method for flat panel display (FPD) polarizing films | GB/T 31379-2015 | 2015-10-1 |
Test method of flat panel display (FPD) color filters―Part 1:Color and transmittance | GB/T 31370.1-2015 | 2015-10-1 |
Test method of flat panel display (FPD) color filters―Part 2:Light resistance | GB/T 31370.2-2015 | 2015-10-1 |
Test method for surface hardness of flat panel display (FPD) polarizing film | GB/T 31378-2015 | 2015-10-1 |
Test method of flat panel display(FPD)color filters―Part 4:Chemical resistance | GB/T 31370.4-2015 | 2015-10-1 |
Electronic grade hydrofluoric acid for solar cells | GB/T 31369-2015 | 2015-10-1 |
Test Method for Trace Anion in Electronic Grade Water by Ion Chromatography | GB/T 11446.7-2013 | 2014-8-15 |
Test method for SiO2 in electronic grade water by spectrophotometer | GB/T 11446.6-2013 | 2014-8-15 |
Test Method for Total Organic Carbon in Electronic Grade Water | GB/T 11446.8-2013 | 2014-8-15 |
Test method for resistivity of electronic grade water | GB/T 11446.4-2013 | 2014-8-15 |
Test Method for Total Bacterial Count in Electronic Grade Water by Membrane Filters | GB/T 11446.10-2013 | 2014-8-15 |
Generic rules for test methods of electronic grade water | GB/T 11446.3-2013 | 2014-8-15 |
Electronic Grade Water | GB/T 11446.1-2013 | 2014-8-15 |
Test Method for Particles in Electronic Grade Water by Instrument | GB/T 11446.9-2013 | 2014-8-15 |
Test Method for Measuring Trace Metals in Electronic Grade Water by Atomic Absorption Spectrophotometry | GB/T 11446.5-2013 | 2014-8-15 |
Photoimageable plating and etching resist paste of printed circuit board | GB/T 29846-2013 | 2014-4-15 |
Test methods for copper foil used for printed boards | GB/T 29847-2013 | 2014-4-15 |
Alumina Ceramic Substrates for Thick Film Integrated Circuits | GB/T 14619-2013 | 2014-4-15 |
Alumina Ceramic Substrates for Thin Film Integrated Circuits | GB/T 14620-2013 | 2014-4-15 |
Ethylene-vinyl acetate copolymer(EVA)film for encapsulant solar module | GB/T 29848-2013 | 2014-4-15 |
Specifications for metrology patterns for the evaluation of advanced photolithgraphy | GB/T 29844-2013 | 2014-4-15 |
Trichlorosilane for silicon epitaxy—Determination of boron,aluminium,phosphorus,vanadium,chrome,manganese,iron,cobalt,nickel,copper,arsenic,molybdenum and antimony content—Inductively coupled plasma mass spectrometric method | GB/T 29056-2012 | 2013-10-1 |
Encapsulating material of powdered epoxy for electronic components | GB/T 28859-2012 | 2013-2-15 |
Encapsulating material of phenolic for electronic components | GB/T 28858-2012 | 2013-2-15 |
Electronic grade phosphoric acid | GB/T 28159-2011 | 2012-7-1 |
Test methods for gas absorbency and release of getters | GB/T 25497-2010 | 2011-5-1 |
Test methods for composition analysis of getters | GB/T 25494-2010 | 2011-5-1 |
Barium flash getters | GB/T 9505-2010 | 2011-5-1 |
Test methods for metal releasing characteristics of getters | GB/T 25495-2010 | 2011-5-1 |
Test methods for the mechanical properties of getters | GB/T 25496-2010 | 2011-5-1 |
Phosphors for light emitting diodes | SJ/T 11397-2009 | 2010-1-1 |
Test methods for the properties of piezoelectric ceramics - Test for the ageing properties | GB/T 15750-2008 | 2009-4-1 |
Test methods for the properties of piezoelectric ceramics - Test for the performance parameter | GB/T 3389-2008 | 2009-2-1 |
Test methods of the properties for piezoelectric ceramics - Test for relation between electric field and strain | GB/T 16304-2008 | 2009-2-1 |
Glass tube for black-white picture tubes, monochrome displayer tube and electro-optic source | SJ/T 11198-2007 | 2008-1-20 |
Technical data of type DW-203 electronic glass | SJ/T 11369-2007 | 2007-1-4 |
Specification for beryllia ceramic carrier used for photocon devices | SJ 20965-2006 | 2006-12-30 |
Measuring methods for soft ferrite materials | SJ 20966-2006 | 2006-12-30 |
Specification for tungsten-37 rhenium alloy | SJ 20964-2006 | 2006-12-30 |
Frit glass powder | SJ/T 3231-2005 | 2005-9-1 |
Quantity test method of the oxidation sludge in the tin solder | SJ/T 11319-2005 | 2005-9-1 |
Specification for beryllia ceramic sleeves used in microwave electronic tubes | SJ 20900-2004 | 2004-12-1 |
General technical requirements for part manufacture and mechanical assembling of electronics | QJ 548A-2004 | 2004-12-1 |
QJ A 548-2004 General Technical Requirements for Part Manufacture and Mechanical Assembling of Electronics | QJ A 548-2004 | 2004-12-1 |
Molybdenum wire | GB/T 4182-2003 | 2004-8-1 |
Specification for finished fabric woven from E glass for printed boards | SJ/T 11283-2003 | 2003-10-1 |
Specification for E glass paper for printed boards | SJ/T 11282-2003 | 2003-10-1 |
Specification for resistance foil composite material | SJ 20857-2002 | 2003-5-1 |
Semiconductor photoelectric assembly Detail specification for miniature duplex photoelectric localizer for type CBGS 2301 | SJ 20859-2002 | 2003-5-1 |
Specification for molybdenum-copper composite materials bar | SJ 20848-2002 | 2003-3-1 |
No-clean liquid soldering flux | SJ/T 11273-2002 | 2003-3-1 |
Silicon dioxide micropowder for electronic and electrical equipment industry | SJ/T 10675-2002 | 2003-3-1 |
Molybdenum-tungsten alloy rods | GB/T 4186-2002 | 2002-12-1 |
Tungsten-rhenium alloy wires | GB/T 4184-2002 | 2002-12-1 |
Test methods for ceramic properties for electronic and electrical application | GB/T 18791-2002 | 2002-12-1 |
Test methods for the properties of piezoelectric ceramics--Test for Curie temperature Tc | GB/T 3389.3-2001 | 2002-8-1 |
Test method used in tensile strength of ceramic to metal seal | SJ/T 3326-2001 | 2002-5-1 |
The DC critical current measurement for Ag or Ag-alloy sheathed bismuthal oxide superconductor | GB/T 18502-2001 | 2002-5-1 |
Getter terms | GB/T 4314-2000 | 2000-8-1 |
Measurement of magnetic properties of YIG single crystal magnetic-films | SJ/T 11207-1999 | 1999-12-1 |
Terms for liquid crystal materials | SJ/T 11203-1999 | 1999-12-1 |
Quasi-static test method for ferroelectric hysteresis loop in ferroelectric ceramics | GB/T 6426-1999 | 1999-12-1 |
Test method for frequency temperature stability of piezoelectric ceramic vibrator | GB/T 6427-1999 | 1999-12-1 |
The DC electric resistance test method for the critical temperature Tc of a YBa2Cu3O7-δ superconducting thin film | GB/T 17711-1999 | 1999-10-1 |
Test methods for the properties of piezoelectric ceramics Transverse length extension vibration mode for bar | GB/T 2414.2-1998 | 1999-7-1 |
Test methods for the properties of piezoelectric ceramics Radial extension vibration mode for disk | GB/T 2414.1-1998 | 1999-7-1 |
Piezoelectric quartz crystal blank | SJ/T 11199-1999 | 1999-5-1 |
Test method for complex permittivity of solid dielectric materials at microwave frequencies | GB/T 5597-1999 | 1999-1-2 |
Test methods for properties of piezoelectric ceramics. Thickness-shear vibration mode for rectangular plate | GB/T 3389.6-1997 | 1998-9-1 |
Tungsten wires | GB/T 4181-1997 | 1998-8-1 |
Potassium silicate solution for use in electronic industry | GB/T 9394-1998 | 1998-6-17 |
Test method for dielectric properties of dielectric crystal | GB/T 16822-1997 | 1998-2-1 |
Barium flash getters | GB/T 9505-1998 | 1998-1-2 |
Methods of Measurement for the Emission Spectra and Color Coordinates of Calcium Halophosphate Fluorescent Powder for Lamps | QB/T 2261-1996 | 1997-7-1 |
Calcium Halophosphate Fluorescent Powder for Fluorescent Lamps | QB/T 2259-1996 | 1997-7-1 |
Methods of Measurement for the Relative Brightness of Calcium Halophosphate Fluorescent Powder for Lamps | QB/T 2260-1996 | 1997-7-1 |
Structure ceramic materials usec in electronic components | GB/T 5593-1996 | 1997-5-1 |
Specification for photoresist/E-beam resist for hard surface photoplates | GB/T 16527-1996 | 1997-5-1 |
Specification for round quartz photomask substrates | GB/T 16523-1996 | 1997-5-1 |
Ceramic dielectric materials used for capacitors | GB/T 5596-1996 | 1997-5-1 |
Zinc oxide ceramics for use in varistors | GB/T 16528-1996 | 1997-5-1 |
Vocabulary for ferroelectric and piezoelectric ceramics | GB/T 3389.1-1996 | 1997-5-1 |
Type of phosphor | GB/T 4073-1996 | 1996-9-9 |
General method of the phosphor | GB/T 4070-1996 | 1996-9-9 |
Test methods for the properties of piezoelectric ceramics--Thickness extension vibration mode for disk | GB/T 3389.5-1995 | 1996-4-1 |
Cold plate design guideline for electronic equipment | GB/T 15428-1995 | 1995-8-1 |
Aluminium plate clad with plastics for electronic equipments | GB/T 15429-1995 | 1995-8-1 |
Generic specification for piezoelectric ceramic for use in filters | GB/T 15155-1994 | 1995-2-1 |
- Doped yttrium aluminum garnet laser rods | GB/T 13842-1992 | 1993-8-1 |
on sapphire epitaxial wafers | GB/T 14015-1992 | 1993-8-1 |
monocrystalline sapphire substrates | GB/T 13843-1992 | 1993-8-1 |
Terms for the measurements of the properties of the piezoelectric crystals | GB/T 12633-1990 | 1991-10-1 |
The properties and the test methods for antistatic silk-like fabric of synthetic filament in electronic industry | GB 12059-1989 | 1990-7-1 |
method for impruities in the synthetic quartz crystal | GB 11113-1989 | 1990-3-1 |
Phosphors Y30-G1 for color display tubes | GB 11496.1-1989 | 1990-3-1 |
Terms for electronic-grade water | GB 11446.2-1989 | 1990-3-1 |
Test methods for the properties of piezoelectric ceramics material with the low mechanical quality factor | GB/T 11320-1989 | 1990-3-1 |
Phosphor Y30-R1 for color display tybes | GB 11496.3-1989 | 1990-3-1 |
Phosphor Y30-B1 for color display tubes | GB 11496.2-1989 | 1990-3-1 |
for detecting dislocations of synthetic quartz crystal using X-ray topographic technique | GB 11114-1989 | 1990-3-1 |
Test method for normal pulse lasing threshold and slope efficiency of Nd: YAG laser rods | GB 11297.4-1989 | 1990-1-1 |
Test methods for the properties of piezoelectric ceramics; Quasi-static test for piezoelectric strain constant d33 | GB 11309-1989 | 1990-1-1 |
Test method for side direction scattering coefficient of laser rods | GB 11297.2-1989 | 1990-1-1 |
Commonly used terms for semiconductor photoelectric materials and pyroelectric materials in infrared detecting materials | GB 11294-1989 | 1990-1-1 |
Test method for continuous lasing threshold, slope efficiency and output power of Nd: YAG laser rods | GB 11297.5-1989 | 1990-1-1 |
Test method for pyroelectric coefficient of pyroelectric materials | GB 11297.8-1989 | 1990-1-1 |
Satndard method for showing and measuring dislocation etch pits in Indium Antimonide single crystal | GB 11297.6-1989 | 1990-1-1 |
designation for laser crystal rods | GB 11295-1989 | 1990-1-1 |
Stranded tungsten wire | GB 11247.1-1989 | 1990-1-1 |
Test method for extinction ratio of LN, kDP and kDP electrooptic crystal | GB 11297.12-1989 | 1990-1-1 |
terms and definitions of solid-state laser material | GB 11293-1989 | 1990-1-1 |
Test methods for the properties of piezoelectric ceramics test for poisson | GB 11311-1989 | 1990-1-1 |
Test methods for SA W properties of piezoelectric ceramics and crystals | GB 11312-1989 | 1990-1-1 |
Test method for extinction ratio of Nd:YAG laser rods | GB/T 11297.3-1989 | 1990-1-1 |
Test method for the dielectric constant of Pyroelectric materials | GB 11297.11-1989 | 1990-1-1 |
Test method for wavefront distortion of laser rods | GB/T 11297.1-1989 | 1990-1-1 |
Tungsten heater element | GB 11247.2-1989 | 1990-1-1 |
Designations for infrared detecting materials | GB 11296-1989 | 1990-1-1 |
Test method for dielectric tangent of loss angle of pyroelectric material | GB 11297.9-1989 | 1990-1-1 |
Test method for resistivity and Hall coefficient in InSb single crystals | GB 11297.7-1989 | 1990-1-1 |
Test method for Curie temperature of pyroelectric materials | GB 11297.10-1989 | 1990-1-1 |
Test methods for the properties of piezoelectric ceramics; Test methods for temperature characteristics of relative free dielectric constants | GB 11310-1989 | 1990-1-1 |
Dumet wire | GB 11248-1989 | 1990-1-1 |
Phosphor G16 for double-decker screen indicator tubes | GB 10316-1988 | 1989-10-1 |
Phosphor Y16 for radar indicator tubes | GB 10313-1988 | 1989-10-1 |
Phosphor Y3 for double-decker screen indicator tubes | GB 10314-1988 | 1989-10-1 |
Phosphor Y4-W2 for black-white picture tubes | GB 10310-1988 | 1989-10-1 |
Phosphor Y20 for low-light-level picture tubes and storage tubes | GB 10318-1988 | 1989-10-1 |
Phosphor G11 for double-decker screen indicator tubes | GB 10315-1988 | 1989-10-1 |
Phosphor Y4-Y2 for black-white picture tubes | GB 10312-1988 | 1989-10-1 |
Phosphor Y10 for oscilloscope tubes and image display tubes | GB 10317-1988 | 1989-10-1 |
Phosphor Y14 for oscilloscope tubes and display tubes | GB/T 10309-1988 | 1989-10-1 |
Phosphor Y4-B1 for black-white picture tubes | GB 10311-1988 | 1989-10-1 |
Phosphor Y1 for oscilloscope tubes and display tubes | GB/T 10308-1988 | 1989-10-1 |
Measuring methods for properties of gyromagnetic materials intended for application at microwave frequencies | GB 9633-1988 | 1989-2-1 |
Test method for complex permittivity of solid dielectric materials at millimeter wave frequencies using Quasi-Optic cavity technique | GB 9534-1988 | 1989-2-1 |
Analysis of chromium oxide (Cr2O3) in color picture tube glass | GB 9474.5-1988 | 1988-12-1 |
Method of measurement for light transmissivity (t546) of color pictrure tube glass panel | GB 9474.3-1988 | 1988-12-1 |
Analysis of chlorine (Cl)in color picture tube glass | GB 9474.6-1988 | 1988-12-1 |
Method of measurement for residue stress in picture tube valve | GB 9474.1-1988 | 1988-12-1 |
Test method for granulometric distribution of alundum powder for vacuum tubes by density balance | GB 9475-1988 | 1988-12-1 |
Analysis of sulfur (S) in color picture tube glass | GB 9474.7-1988 | 1988-12-1 |
Determination of alumina (A12O3) in electronic glass by EDTA complexicretric titration | GB 9000.7-1988 | 1988-10-1 |
Determination of boron oxide (B2O3) in electronic glass | GB 9000.3-1988 | 1988-10-1 |
Determination of alumina (Al2O3) and zine oxide (ZnO) in electronic glass by EDTA complexiometric titration | GB 9000.8-1988 | 1988-10-1 |
Determination of silica (SiO2) in electronic glass | GB 9000.2-1988 | 1988-10-1 |
Determination of Co2O3 NiO AND MnO2 in electronic glass by atomic absorption | GB 9000.13-1988 | 1988-10-1 |
The general rules for chemical analysis of electronic glass | GB 9000.1-1988 | 1988-10-1 |
Determination of manganese dioxide in electronic glass by the potassium periodate oxidation method | GB 9000.17-1988 | 1988-10-1 |
Determination of baryta (BaO) in electronic glass | GB 9000.6-1988 | 1988-10-1 |
Determination of CaO SrO AND MgO in electronic glass by atomic absorption | GB 9000.11-1988 | 1988-10-1 |
Determination of Li2O Na20 and K20 in electronic glass by atomic absorption | GB 9000.10-1988 | 1988-10-1 |
Test method for gettering properties of barium flash getter | GB 9506.7-1988 | 1988-1-2 |
Test method for barium yield of barium flash getter | GB 9506.2-1988 | 1988-1-2 |
Molybdenum tungsten alloy rods | GB/T 4186-1984 | 1984-11-1 |
Tungsten rhenium alloy wires | GB/T 4184-1984 | 1984-11-1 |
Piezoelectric ceramic materials - Measuring methods for determination of volume density | GB 2413-1981 | 1981-10-1 |
Test methods for field-excited phosphor | SJ/Z 610-73 | 1973-6-1 |
Test methods for field-excited phosphor | SJ/Z 610-1973 | 1973-6-1 |