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Chinese National Standard List: Special electronic technology material

Title Standard No. Implemented On
Materials for organic light emitting diode display(OLED)—Test method of glass transfer temperature—Differential scanning calorimetry (DSC)GB/T 37945-20192019-12-1
Detection method of degree of sphericity of spherical silica for electronic packaging—Particle dynamic photoelectric projection methodGB/T 37406-20192019-12-1
Test method of thermal stability of materials for organic light emitting diode display(OLED)GB/T 37946-20192019-12-1
Purity test method of small molecule materials applied in organic light emitting diode display(OLED)—High performance liquid chromatography (HPLC)GB/T 37949-20192019-12-1
Test method for pyroelectric coefficient of materials under DC bias fieldGB/T 37255-20182019-11-1
Specification for common mixture liquid crystal materialsGB/T 37082-20182019-7-1
Nanoscale barium titanateGB/T 36595-20182019-6-1
Test method of flat panel display(FPD)color filters—Part 5:Contrast ratioGB/T 31370.5-20182019-4-1
Ethylene--vinyl acetate copolymer (EVA) film for PV moduleGB/T 29848-20182019-4-1
Specification for liquid crystal monomersGB/T 36647-20182019-4-1
Specification for TFT liquid crystal monomersGB/T 36648-20182019-4-1
Test method for alpha crystalline silicon dioxide content of spherical silica powder for electronic packaging—XRD methodGB/T 36655-20182019-1-1
Test method for surface scratch resistance of flat panel display(FPD)polarizing filmGB/T 36952-20182018-12-28
General technical requirements for electromagnetic shielding filmGB/T 35575-20172018-7-1
Getter termsGB/T 4314-20172018-7-1
Tungsten wiresGB/T 4181-20172018-2-1
Creep testing，high temperature treatment and metallographic examination of the tungsten wireGB/T 4194-20172018-2-1
Tungsten bars and rodsGB/T 4187-20172018-2-1
Molybdenum bars and molybdenum rodsGB/T 4188-20172018-2-1
Molybdenum-tungsten alloy bars and rodsGB/T 4185-20172018-2-1
Test method for wavefront distortion of laser rodsGB/T 11297.1-20172017-12-1
Neodymium-doped Yttrium Aluminum Garnet laser rodsGB/T 13842-20172017-12-1
Test method for dielectric tangent of loss angle of pyroelectric materialsGB/T 11297.9-20152016-7-1
Test method for dielectric constant of pyroelectric materialsGB/T 11297.11-20152016-7-1
Test method for curie temperature of pyroelectric materialsGB/T 11297.10-20152016-7-1
Test method for pyroelectric coefficient of pyroelectric materialsGB/T 11297.8-20152016-7-1
Test method for determining the content of vinyl acetate in ethylene-vinyl acetatecopolymer applied in photovoltaic modules―Thermal gravimetric analysis(TGA)GB/T 31984-20152016-5-1
Tin-coated copper ribbon for photovoltaic applicationGB/T 31985-20152016-5-1
Phosphors―Part 2:TypesGB/T 5838.2-20152016-1-1
Phosphors―Part 1:TerminologyGB/T 5838.1-20152016-1-1
Phosphors for plasma display panelGB/T 31417-20152016-1-1
Test methods for properties of structure ceramicused in electronic components and device―Part 3:Test method for mean coefficient of linear expansionGB/T 5594.3-20152016-1-1
Test methods for properties of structure ceramicused in electronic components and device―Part 7:Test method for liquid permeabilityGB/T 5594.7-20152016-1-1
Phosphors―Part 4-5:Phosphor for color display tubesGB/T 5838.45-20152016-1-1
Test method for thermal conductivity of beryllium oxide ceramicsGB/T 5598-20152016-1-1
Phosphors―Part 4-3:Phosphors for oscilloscope tubes and display tubesGB/T 5838.43-20152016-1-1
Semiconductor materials cutting fluidGB/T 31469-20152016-1-1
Test methods for properties of structure ceramic used in electronic components and device―Part 8:Test method for microstructureGB/T 5594.8-20152016-1-1
Phosphors―Part 3:Test methods for propertiesGB/T 5838.3-20152016-1-1
Structure ceramic materials used in electronic component and deviceGB/T 5593-20152016-1-1
Phosphors―Part 4-4:Phosphor for color picture tubesGB/T 5838.44-20152016-1-1
Test methods for properties of structure ceramics used in electronic component and device―Part 6:Test method for chemical durabilityGB/T 5594.6-20152016-1-1
Phosphors―Part 4-1:Phosphor for black-white picture tubesGB/T 5838.41-20152016-1-1
Phosphors―Part 4-2:Phosphor for indicator tubesGB/T 5838.42-20152016-1-1
Test method of flat panel display(FPD)color filters―Part 3:Heat resistanceGB/T 31370.3-20152015-10-1
Test method for flat panel display (FPD) polarizing filmsGB/T 31379-20152015-10-1
Test method of flat panel display (FPD) color filters―Part 1:Color and transmittanceGB/T 31370.1-20152015-10-1
Test method of flat panel display (FPD) color filters―Part 2:Light resistanceGB/T 31370.2-20152015-10-1
Test method for surface hardness of flat panel display (FPD) polarizing filmGB/T 31378-20152015-10-1
Test method of flat panel display(FPD)color filters―Part 4:Chemical resistanceGB/T 31370.4-20152015-10-1
Electronic grade hydrofluoric acid for solar cellsGB/T 31369-20152015-10-1
Test Method for Trace Anion in Electronic Grade Water by Ion ChromatographyGB/T 11446.7-20132014-8-15
Test method for SiO2 in electronic grade water by spectrophotometerGB/T 11446.6-20132014-8-15
Test Method for Total Organic Carbon in Electronic Grade WaterGB/T 11446.8-20132014-8-15
Test method for resistivity of electronic grade waterGB/T 11446.4-20132014-8-15
Test Method for Total Bacterial Count in Electronic Grade Water by Membrane FiltersGB/T 11446.10-20132014-8-15
Generic rules for test methods of electronic grade waterGB/T 11446.3-20132014-8-15
Electronic Grade WaterGB/T 11446.1-20132014-8-15
Test Method for Particles in Electronic Grade Water by InstrumentGB/T 11446.9-20132014-8-15
Test Method for Measuring Trace Metals in Electronic Grade Water by Atomic Absorption SpectrophotometryGB/T 11446.5-20132014-8-15
Photoimageable plating and etching resist paste of printed circuit boardGB/T 29846-20132014-4-15
Test methods for copper foil used for printed boardsGB/T 29847-20132014-4-15
Alumina Ceramic Substrates for Thick Film Integrated CircuitsGB/T 14619-20132014-4-15
Alumina Ceramic Substrates for Thin Film Integrated CircuitsGB/T 14620-20132014-4-15
Ethylene-vinyl acetate copolymer(EVA)film for encapsulant solar moduleGB/T 29848-20132014-4-15
Specifications for metrology patterns for the evaluation of advanced photolithgraphyGB/T 29844-20132014-4-15
Trichlorosilane for silicon epitaxy—Determination of boron,aluminium,phosphorus,vanadium,chrome,manganese,iron,cobalt,nickel,copper,arsenic,molybdenum and antimony content—Inductively coupled plasma mass spectrometric methodGB/T 29056-20122013-10-1
Encapsulating material of powdered epoxy for electronic componentsGB/T 28859-20122013-2-15
Encapsulating material of phenolic for electronic componentsGB/T 28858-20122013-2-15
Electronic grade phosphoric acidGB/T 28159-20112012-7-1
Test methods for gas absorbency and release of gettersGB/T 25497-20102011-5-1
Test methods for composition analysis of gettersGB/T 25494-20102011-5-1
Barium flash gettersGB/T 9505-20102011-5-1
Test methods for metal releasing characteristics of gettersGB/T 25495-20102011-5-1
Test methods for the mechanical properties of gettersGB/T 25496-20102011-5-1
Phosphors for light emitting diodesSJ/T 11397-20092010-1-1
Test methods for the properties of piezoelectric ceramics - Test for the ageing propertiesGB/T 15750-20082009-4-1
Test methods for the properties of piezoelectric ceramics - Test for the performance parameterGB/T 3389-20082009-2-1
Test methods of the properties for piezoelectric ceramics - Test for relation between electric field and strainGB/T 16304-20082009-2-1
Glass tube for black-white picture tubes, monochrome displayer tube and electro-optic sourceSJ/T 11198-20072008-1-20
Technical data of type DW-203 electronic glassSJ/T 11369-20072007-1-4
Specification for beryllia ceramic carrier used for photocon devicesSJ 20965-20062006-12-30
Measuring methods for soft ferrite materialsSJ 20966-20062006-12-30
Specification for tungsten-37 rhenium alloySJ 20964-20062006-12-30
Frit glass powderSJ/T 3231-20052005-9-1
Quantity test method of the oxidation sludge in the tin solderSJ/T 11319-20052005-9-1
Specification for beryllia ceramic sleeves used in microwave electronic tubesSJ 20900-20042004-12-1
General technical requirements for part manufacture and mechanical assembling of electronicsQJ 548A-20042004-12-1
QJ A 548-2004 General Technical Requirements for Part Manufacture and Mechanical Assembling of ElectronicsQJ A 548-20042004-12-1
Molybdenum wireGB/T 4182-20032004-8-1
Specification for finished fabric woven from E glass for printed boardsSJ/T 11283-20032003-10-1
Specification for E glass paper for printed boardsSJ/T 11282-20032003-10-1
Specification for resistance foil composite materialSJ 20857-20022003-5-1
Semiconductor photoelectric assembly Detail specification for miniature duplex photoelectric localizer for type CBGS 2301SJ 20859-20022003-5-1
Specification for molybdenum-copper composite materials barSJ 20848-20022003-3-1
No-clean liquid soldering fluxSJ/T 11273-20022003-3-1
Silicon dioxide micropowder for electronic and electrical equipment industrySJ/T 10675-20022003-3-1
Molybdenum-tungsten alloy rodsGB/T 4186-20022002-12-1
Tungsten-rhenium alloy wiresGB/T 4184-20022002-12-1
Test methods for ceramic properties for electronic and electrical applicationGB/T 18791-20022002-12-1
Test methods for the properties of piezoelectric ceramics--Test for Curie temperature TcGB/T 3389.3-20012002-8-1
Test method used in tensile strength of ceramic to metal sealSJ/T 3326-20012002-5-1
The DC critical current measurement for Ag or Ag-alloy sheathed bismuthal oxide superconductorGB/T 18502-20012002-5-1
Getter termsGB/T 4314-20002000-8-1
Measurement of magnetic properties of YIG single crystal magnetic-filmsSJ/T 11207-19991999-12-1
Terms for liquid crystal materialsSJ/T 11203-19991999-12-1
Quasi-static test method for ferroelectric hysteresis loop in ferroelectric ceramicsGB/T 6426-19991999-12-1
Test method for frequency temperature stability of piezoelectric ceramic vibratorGB/T 6427-19991999-12-1
The DC electric resistance test method for the critical temperature Tc of a YBa2Cu3O7-δ superconducting thin filmGB/T 17711-19991999-10-1
Test methods for the properties of piezoelectric ceramics Transverse length extension vibration mode for barGB/T 2414.2-19981999-7-1
Test methods for the properties of piezoelectric ceramics Radial extension vibration mode for diskGB/T 2414.1-19981999-7-1
Piezoelectric quartz crystal blankSJ/T 11199-19991999-5-1
Test method for complex permittivity of solid dielectric materials at microwave frequenciesGB/T 5597-19991999-1-2
Test methods for properties of piezoelectric ceramics. Thickness-shear vibration mode for rectangular plateGB/T 3389.6-19971998-9-1
Tungsten wiresGB/T 4181-19971998-8-1
Potassium silicate solution for use in electronic industryGB/T 9394-19981998-6-17
Test method for dielectric properties of dielectric crystalGB/T 16822-19971998-2-1
Barium flash gettersGB/T 9505-19981998-1-2
Methods of Measurement for the Emission Spectra and Color Coordinates of Calcium Halophosphate Fluorescent Powder for LampsQB/T 2261-19961997-7-1
Calcium Halophosphate Fluorescent Powder for Fluorescent LampsQB/T 2259-19961997-7-1
Methods of Measurement for the Relative Brightness of Calcium Halophosphate Fluorescent Powder for LampsQB/T 2260-19961997-7-1
Structure ceramic materials usec in electronic componentsGB/T 5593-19961997-5-1
Specification for photoresist/E-beam resist for hard surface photoplatesGB/T 16527-19961997-5-1
Specification for round quartz photomask substratesGB/T 16523-19961997-5-1
Ceramic dielectric materials used for capacitorsGB/T 5596-19961997-5-1
Zinc oxide ceramics for use in varistorsGB/T 16528-19961997-5-1
Vocabulary for ferroelectric and piezoelectric ceramicsGB/T 3389.1-19961997-5-1
Type of phosphorGB/T 4073-19961996-9-9
General method of the phosphorGB/T 4070-19961996-9-9
Test methods for the properties of piezoelectric ceramics--Thickness extension vibration mode for diskGB/T 3389.5-19951996-4-1
Cold plate design guideline for electronic equipmentGB/T 15428-19951995-8-1
Aluminium plate clad with plastics for electronic equipmentsGB/T 15429-19951995-8-1
Generic specification for piezoelectric ceramic for use in filtersGB/T 15155-19941995-2-1
- Doped yttrium aluminum garnet laser rodsGB/T 13842-19921993-8-1
on sapphire epitaxial wafersGB/T 14015-19921993-8-1
monocrystalline sapphire substratesGB/T 13843-19921993-8-1
Terms for the measurements of the properties of the piezoelectric crystalsGB/T 12633-19901991-10-1
The properties and the test methods for antistatic silk-like fabric of synthetic filament in electronic industryGB 12059-19891990-7-1
method for impruities in the synthetic quartz crystalGB 11113-19891990-3-1
Phosphors Y30-G1 for color display tubesGB 11496.1-19891990-3-1
Terms for electronic-grade waterGB 11446.2-19891990-3-1
Test methods for the properties of piezoelectric ceramics material with the low mechanical quality factorGB/T 11320-19891990-3-1
Phosphor Y30-R1 for color display tybesGB 11496.3-19891990-3-1
Phosphor Y30-B1 for color display tubesGB 11496.2-19891990-3-1
for detecting dislocations of synthetic quartz crystal using X-ray topographic techniqueGB 11114-19891990-3-1
Test method for normal pulse lasing threshold and slope efficiency of Nd: YAG laser rodsGB 11297.4-19891990-1-1
Test methods for the properties of piezoelectric ceramics; Quasi-static test for piezoelectric strain constant d33GB 11309-19891990-1-1
Test method for side direction scattering coefficient of laser rodsGB 11297.2-19891990-1-1
Commonly used terms for semiconductor photoelectric materials and pyroelectric materials in infrared detecting materialsGB 11294-19891990-1-1
Test method for continuous lasing threshold, slope efficiency and output power of Nd: YAG laser rodsGB 11297.5-19891990-1-1
Test method for pyroelectric coefficient of pyroelectric materialsGB 11297.8-19891990-1-1
Satndard method for showing and measuring dislocation etch pits in Indium Antimonide single crystalGB 11297.6-19891990-1-1
designation for laser crystal rodsGB 11295-19891990-1-1
Stranded tungsten wireGB 11247.1-19891990-1-1
Test method for extinction ratio of LN, kDP and kDP electrooptic crystalGB 11297.12-19891990-1-1
terms and definitions of solid-state laser materialGB 11293-19891990-1-1
Test methods for the properties of piezoelectric ceramics test for poissonGB 11311-19891990-1-1
Test methods for SA W properties of piezoelectric ceramics and crystalsGB 11312-19891990-1-1
Test method for extinction ratio of Nd:YAG laser rodsGB/T 11297.3-19891990-1-1
Test method for the dielectric constant of Pyroelectric materialsGB 11297.11-19891990-1-1
Test method for wavefront distortion of laser rodsGB/T 11297.1-19891990-1-1
Tungsten heater elementGB 11247.2-19891990-1-1
Designations for infrared detecting materialsGB 11296-19891990-1-1
Test method for dielectric tangent of loss angle of pyroelectric materialGB 11297.9-19891990-1-1
Test method for resistivity and Hall coefficient in InSb single crystalsGB 11297.7-19891990-1-1
Test method for Curie temperature of pyroelectric materialsGB 11297.10-19891990-1-1
Test methods for the properties of piezoelectric ceramics; Test methods for temperature characteristics of relative free dielectric constantsGB 11310-19891990-1-1
Dumet wireGB 11248-19891990-1-1
Phosphor G16 for double-decker screen indicator tubesGB 10316-19881989-10-1
Phosphor Y16 for radar indicator tubesGB 10313-19881989-10-1
Phosphor Y3 for double-decker screen indicator tubesGB 10314-19881989-10-1
Phosphor Y4-W2 for black-white picture tubesGB 10310-19881989-10-1
Phosphor Y20 for low-light-level picture tubes and storage tubesGB 10318-19881989-10-1
Phosphor G11 for double-decker screen indicator tubesGB 10315-19881989-10-1
Phosphor Y4-Y2 for black-white picture tubesGB 10312-19881989-10-1
Phosphor Y10 for oscilloscope tubes and image display tubesGB 10317-19881989-10-1
Phosphor Y14 for oscilloscope tubes and display tubesGB/T 10309-19881989-10-1
Phosphor Y4-B1 for black-white picture tubesGB 10311-19881989-10-1
Phosphor Y1 for oscilloscope tubes and display tubesGB/T 10308-19881989-10-1
Measuring methods for properties of gyromagnetic materials intended for application at microwave frequenciesGB 9633-19881989-2-1
Test method for complex permittivity of solid dielectric materials at millimeter wave frequencies using Quasi-Optic cavity techniqueGB 9534-19881989-2-1
Analysis of chromium oxide (Cr2O3) in color picture tube glassGB 9474.5-19881988-12-1
Method of measurement for light transmissivity (t546) of color pictrure tube glass panelGB 9474.3-19881988-12-1
Analysis of chlorine (Cl)in color picture tube glassGB 9474.6-19881988-12-1
Method of measurement for residue stress in picture tube valveGB 9474.1-19881988-12-1
Test method for granulometric distribution of alundum powder for vacuum tubes by density balanceGB 9475-19881988-12-1
Analysis of sulfur (S) in color picture tube glassGB 9474.7-19881988-12-1
Determination of alumina (A12O3) in electronic glass by EDTA complexicretric titrationGB 9000.7-19881988-10-1
Determination of boron oxide (B2O3) in electronic glassGB 9000.3-19881988-10-1
Determination of alumina (Al2O3) and zine oxide (ZnO) in electronic glass by EDTA complexiometric titrationGB 9000.8-19881988-10-1
Determination of silica (SiO2) in electronic glassGB 9000.2-19881988-10-1
Determination of Co2O3 NiO AND MnO2 in electronic glass by atomic absorptionGB 9000.13-19881988-10-1
The general rules for chemical analysis of electronic glassGB 9000.1-19881988-10-1
Determination of manganese dioxide in electronic glass by the potassium periodate oxidation methodGB 9000.17-19881988-10-1
Determination of baryta (BaO) in electronic glassGB 9000.6-19881988-10-1
Determination of CaO SrO AND MgO in electronic glass by atomic absorptionGB 9000.11-19881988-10-1
Determination of Li2O Na20 and K20 in electronic glass by atomic absorptionGB 9000.10-19881988-10-1
Test method for gettering properties of barium flash getterGB 9506.7-19881988-1-2
Test method for barium yield of barium flash getterGB 9506.2-19881988-1-2
Molybdenum tungsten alloy rodsGB/T 4186-19841984-11-1
Tungsten rhenium alloy wiresGB/T 4184-19841984-11-1
Piezoelectric ceramic materials - Measuring methods for determination of volume densityGB 2413-19811981-10-1
Test methods for field-excited phosphorSJ/Z 610-731973-6-1
Test methods for field-excited phosphorSJ/Z 610-19731973-6-1
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