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| Chinese National Standard Category: Material and component for instrument and meter |
| English Title: | Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging |
| Chinese Title: | 光学元件表面疵病定量检测方法 显微散射暗场成像法 |
| Standard No.: | GB/T 41805-2022 |
| Category No.: | N05 |
| Issued by: | SAMR; SAC |
| Issued on: | 2022-10-12 |
| Implemented on: | 2023-5-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 8500 words |
| Similar Standards: |
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