| Title |
Standard No. |
Implemented On |
| Terminology for power supplies for use in electronic equipment | SJ 1670-1980 | |
| Verification regulation of model CY16602 standards large capacitance box | SJ 20244-1993 | |
| Solid carbide topper cutters for printed wiring boards | SJ 2756-1987 | |
| Requirements of readiness and methods of inspection and assessment for the power source used to test the electrical properties of transmitting tubes | SJ/T 31168-1994 | |
| Verification regulation of model CC5361 degital TV signal generator | SJ 20257-1993 | |
| Detail specification for RFGB101-100 RF power type fixed resistors | SJ 58263/5-2016 | |
| Guidelines for quality plan | SJ/T 10466.20-1995 | |
| Recommended values of input/output characteristic for single-sideband power line carrier terminals | SJ/Z 9103-1987 | |
| Basic environmental testing procedures--Part 2: Tests--Test Z/BM: Combined dry heat/low air pressure | SJ/Z 9001.9-1987 | |
| Amorphous silicon reference solar cell | SJ/T 10698-1996 | |
| Preparation methods for electrical skeletons--General rules | SJ/T 10148.2-1991 | |
| Detail specification for silicon PNP epitaxial planar high frequency low power transistors, Type 3CG103 | SJ 1471-1979 | |
| Requirements of readiness and methods of inspection and assessment for deslagging systems | SJ/T 31466-1994 | |
| Methods of measurement for hall mobility and carrier concentration of Gallium arsenide and Indium phosphide | SJ 3244.1-1989 | |
| Chinese Industry Standard | SJ/T 10732-1992 | |
| Gas-filled microwave switching tubes, Type RX-32 | SJ 1723-1981 | |
| Detail specification for silicon PNP epitaxial planar low power switching transistors, Type 3CK130 | SJ 1848-1981 | |
| permanent magnet d. c. motors for pagers | SJ/T 11137-1997 | |
| Detail specification for silicon NPN high-frequency high power transistors, Type 3DA151 | SJ 1682-1980 | |
| Blank detail specification for fixed metallized polyproptlene capacitors for use in a. c. motors | SJ 2600-1985 | |
| Guidelines for preparing quality manuals | SJ/T 10466.2-1993 | |
| Rotary wafer switches (low current rating) with central mounting, maximum number of positions: 12; maximum diameter: 25mm, Type KX05 | SJ 740-1986 | |
| Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification, Type 3DG3177 | SJ 3122-1988 | |
| Detail specification for type RP64 ceramic connector of cooled infrared focal plane array detector | SJ 21061/3-2016 | |
| Vented nickel-cadmium prismatic rechargeable single cells | SJ/T 10622-1995 | |
| Detailed specifications for electronic components - Semiconductor integrated circuits - CT1008 TTL Quad 2-input positive-NAND gate (Applicable for certification) | SJ/T 10811-1996 | |
| Guide for the inclusion of lot-by-lot and periodic inspection procedures in specifications for electronic components (or parts) | SJ/Z 9006-1987 | |
| Detailed specifications for electronic components - Semiconductor integrated circuits - CT1020 TTL dual 4-input positive-NAND gate (Applicable for certification) | SJ/T 10813-1996 | |
| Requirements of readiness and methods of inspection and assessment for core shooting machines | SJ/T 31042-1994 | |
| Copper clad metal-based laminate specification for printed circuits | SJ 21189-2016 | |
| General specification for filter inductors for use in colour television broadcasting receivers | SJ 2920-1988 | |
| Military command and control equipment - Safety design requirements - Part 4: Mechanical structural design requirements | SJ 21140.4-2016 | |
| Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 30mm, Type KX17 | SJ 2694-1986 | |
| Miniature axial blowers for commercial frequency--Quality grading standard | SJ/T 9559.6-1993 | |
| Specifications for determination of LGB0405-type fixed inductors used for VCR | SJ/Z 9198-1995 | |
| Detail specification for silicon NPN diffused mesa low-frequency high power transistors, Type 3DD170, 3DD171 and 3DD172 | SJ 1644-1980 | |
| Requirements of readiness and methods of inspection and assessment for manual platform button stem machines | SJ/T 31146-1994 | |
| Quality grading standard for low-power wirewound and non-wirewound potentiometers | SJ/T 9548.3-1993 | |
| Power supplies | SJ/T 9167.6-1993 | |
| Detail specification for high temperature-resistant multi-mode fiber of A1b-1/2-G200 | SJ 51427/13-2016 | |
| Level oscillators for Type YX5071 | SJ/T 10104-1991 | |
| Technical data of type DB-474 electronic glass | SJ/T 10588.21-1994 | |
| Semiconductor discrete device. Detail specification for type QL71 Silicon single phase full wave bridge rectifier | SJ 20064-1992 | |
| Packaging of leadless components on continuous tapes for automatic handling | SJ/T 10358-1993 | |
| General specifications for the theater network communication systems | SJ 20752-1999 | |
| Requirements of readiness and methods of inspection and assessment for DRS-II840 laser retouching machines | SJ/T 31105-1994 | |
| Super VCD disc electrical performance test disc (physical standards) | SJ/T 11202.1-1999 | |
| Detailed specification of CY-YZ-101 gauge pressure sensor | SJ 54409/8-2016 | |
| Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories | SJ/T 10740-1996 | |
| Methods of measurement for d. c. digital voltmeters | SJ 2315-1983 | |
| Sealed constant temperature relay--Quality grading standard | SJ/T 9560.25-1993 | |
| Quality grading standard for stereo phones | SJ/T 9563-1995 | |
| General specification for reactive ion etching machines | SJ 21131-2016 | |
| Detail specification for electronic component. Semiconductor integrated circuit-CC4028 CMOS 4-line to 10-line decoder (with BCD-in) | SJ/T 10039-1991 | |
| Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification, Type 3DG1779 | SJ 3123-1988 | |
| Detail specification for silicon high speed switching rectifier diodes, Type 2CZ307 | SJ 2723-1986 | |
| Detail specification for type GT11 semiconductor sililcon NPN photo-transistor | SJ 50033.40-1994 | |
| Sealed sub-miniature medium power electromagnetic relay--Quality grading standard | SJ/T 9560.3-1993 | |
| Choking methods for acoustic noise of transformers and chokes for use in electronic equipment | SJ/Z 2922-1988 | |
| Semiconductor TV integrated circuits - General principles of measuring methods for audio channel circuits | SJ/T 11005-1996 | |
| Detail specification for N channel junction field-effect low power switching transistors, Type CS49 | SJ 2106-1982 | |
| Specifications for determination of 0. 25W high-stability metal film resistors used for VCR | SJ/Z 9175-1995 | |
| Detail specification of polymer humidity eiement for type CH-DR-002 | SJ 20760.2-2002 | |
| Requirements of readiness and methods of inspection and assessment for YL-1 MOCVD systems | SJ/T 31126-1994 | |
| Methods of measurement for equipment used in terrestrial radio-relay systems--Part 3: Simulated systems--Section 4: Measurements for F. D. M. transmission | SJ/Z 9094.13-1987 | |
| Laser trimming machine process verification method | SJ 21198-2016 | |
| Non-solid aluminium electrolyte capacitors--Quality grading standard | SJ/T 9503.1-1991 | |
| Specification for WXF0812-L16 Low Noise Amplifier Chip | SJ 21134-2016 | |
| Horizontal-linearity coils for colour TV recievers--Quality grading standard | SJ/T 9552.1-1993 | |
| Piezoelectric and dielectric devices for frequency control and selection Terminology Part 4-3: Materials Materials for dielectric devices | SJ/T 11743.4.3-2019 | |
| Detail specification for N channel junction field-effect low power switching transistors, Type CS47 | SJ 2104-1982 | |
| Technical data of type DB-436 electronic glass | SJ/T 10588.11-1994 | |
| Verification regulation of model CO-14 precise decade capacitance box | SJ 20239-1993 | |
| Detail specification for high frequency rectifier diodes, Types 2CZ90D~90J, 2DZ90D~90J, 2CZ91D~91J, 2DZ91D~91J, 2CZ92D~92J and 2DZ92D~92J | SJ 1948-1981 | |
| D. C. permanent magnet torque motor--Quality grading standard | SJ/T 9559.5-1993 | |
| Hybrid integrated circuits detail specification for type HPA2748 PWM power amplifiers | SJ 52438/12-2002 | |
| Detail specification for low frequency low noise field-effect transistors, Type CS14 | SJ 1987-1981 | |
| Specification for wire MODEMs | SJ 1669-1981 | |
| Electrical relays--Part 15: Enderance tests for electrical relay contacts--Specification for the characterics of test equipment | SJ/Z 9073.3-1987 | |
| Bidirectional bonding sheet | SJ 2435.1-1984 | |
| Detail specification for N channel junction field-effect low power switching transistors, Type CS35 | SJ 2092-1982 | |
| Specifications for determination of 2CZ185 type (MA185-TA5) low-power rectifier diodes and similar products used for VCR | SJ/Z 9169-1995 | |
| 1JGaAs/Ge40 × 80 space with gallium arsenide solar battery detailed specification | SJ 55247/4-2016 | |
| General specification for automated teller machine (ATM) | SJ/T 11213-1999 | |
| Technical data of type DT-842 electronic glass | SJ/T 10592.2-1994 | |
| Methods of measurement for equipment used in terrestrial radio-relay systems--Part 1: Measurements common to sub-systems and simulated systems | SJ/Z 9094.1-1987 | |
| Detail specification for nonshielded ribbon cables with round conductor for Type DVY-1 | SJ 2934-1988 | |
| Chinese Industry Standard | SJ/T 10798-1996 | |
| Detail specification for type RP64 ceramic connector of cooled infrared focal plane array detector | SJ 21061/4-2016 | |
| Coaxial radio-frequency cables with solid polytrafluoroethylene dielectric | SJ/T 1563-1980 | |
| Grneral Principles of measuring methods of FM converter for semiconductor audio integrated circuits | SJ/T 10427.1-1993 | |
| Work safety standardization requirements of military electronics enterprises -Part10: Outfield test | SJ 21494.10-2020 | |
| Unsealed hybrid and solid time delay relay--Quality grading standard | SJ/T 9560.18-1993 | |
| General specification for military electronic test equipment. Requirements and methods for reliability test | SJ 20375-1993 | |
| A. C. servomotor--Quality grading standard | SJ/T 9559.3-1993 | |
| Specifications for determination of 0. 25W and 0. 5W retardant carbon film resistors used for VCR | SJ/Z 9174-1995 | |
| Measurement of output power of power klystrons | SJ 1710-1981 | |
| Method for determination of trace Methane and hydrogen in electronic grade Argon--Argon ionization gas chromatography method | SJ 3240-1989 | |
| Methods of measurement for equipmemt used in terrestrial radio-relay systems--Part 3: Simulated systems--Section 3: Measurements for monochrome and colour television transmission | SJ/Z 9094.12-1987 | |
| Detailed specifications for CJ10 fixed metalized paper dielectric DC capacitors | SJ/T 10748-1996 | |
| Sealed square nickel-cadmium alkaline batteries--Quality grading standard | SJ/T 9550.4-1993 | |
| Detail specification for silicon high speed switching rectifier diodes, Type 2CZ308 | SJ 2724-1986 | |
| Detail specification for RFGB201-100 RF power type fixed resistors | SJ 58263/9-2016 | |
| Rotary wafer switches (low current rating) with central mounting, maximum number of positions: 12; maximum diameter: 40mm, Type KX03 | SJ 738-1986 | |
| Detail specification for silicon PNP low frequency low voltage high power transistors, Type 3CD162 and 3Cd362 | SJ 2363-1983 | |
| Quality control pivot of production for dynamic cone loudspeakers | SJ/T 10420-1993 | |
| O-type backward wave oscillators, Type BB-1A | SJ 1575-1980 | |
| Polymeric materials use in electrical equipment evaluations | SJ/T 9167.17-1993 | |
| General specifications for tin-lead soldering pastes | SJ/T 11186-1998 | |
| CRT display for digital computers--Quality grading standard | SJ/T 9530-1993 | |
| Detail specification for electronic components Electronic tube of type FU-605 | SJ/T 10136-1991 | |
| Quality grading standard on magnetic heads for cassette tape recorders | SJ/T 9518-1993 | |
| Requirements of readiness and methods of inspection and assessment for power capacitors | SJ/T 31398-1994 | |
| Military software C/C ++ Programming requirements Part 2: Program structure and layout design | SJ 21141.2-2016 | |
| Blank detail specification for fixed metallized paper dielectric capacitors for use in a. c. motors | SJ 2602-1985 | |
| Color picture tube manufacturing products comparable energy consumption per unit of production quotas | SJ/T 31470-1995 | |
| General specification for light sources for aeronautics | SJ 20479-1995 | |
| Variable glass vacuum capacitors for Type CKBB750/10/75 | SJ 2765-1987 | |
| Silicon phototransistors | SJ/T 2217-1982 | |
| Basic environmental testing procedures--Part 2: Tests--Test Ca: Damp heat, steady state | SJ/Z 9001.5-1987 | |
| 16 SYK08-16 SYK08-J368, 20SYK08 permanent magnet moving coil servomotors--Quality grading standardJ368, 20SYK08 permanent magnet moving coil servomotors--Quality grading standard | SJ/T 9559.14-1993 | |
| Detailed specifications for electronic components - 3DK105A and 3DK105B bipolar switching transistors (Applicable for certification) | SJ/T 10835-1996 | |
| Sectional specification for surface acoustic wave (SAW) filters for use in electronic equipment--Surface acoustic wave (SAW) filters for IF circuit of color TV receivers | SJ 2971-1988 | |
| General specification for Integrated Cards. Part 1: Basic specification for Cards | SJ/T 11220-2000 | |
| Variable air dielectric vane trimmer capacitors for Type CW3 and CW3S | SJ 2240.3-1982 | |
| Fuseholders | SJ/T 9167.14-1993 | |
| Military command and control equipment - Safety design requirements - Part 5: Thermal design requirements | SJ 21140.5-2016 | |
| Terminology for optical fibers and cables | SJ 1677-1980 | |
| Fibre optic switches--Part 1: Generic specification | SJ/Z 9023.2-1987 | |
| Lithium-manganese dioxide cylindrical cells--Quality grading standard | SJ/T 9550.17-1993 | |
| Requirements of readiness and methods of inspection and assessment for resistor varnishing machines | SJ/T 31269-1994 | |
| Chrome blanks | SJ/T 10857-1996 | |
| Enveloped cadmium sulfide photoresistors for Type MG41 | SJ 2030-1982 | |
| Methods of measurement for dynamic impedance of silicon current regulator diodes | SJ 2139-1982 | |
| Detail specifications for high accruacy horizon-meter for type CW -- 14 | SJ 20873/1-2003 | |
| LC high-pass filters for TV tuners | SJ 2973-1988 | |
| Requirements of readiness and methods of inspection and assessment for negative/positive resist developers and spin coaters | SJ/T 31079-1994 | |
| KW4 sensitive switch--Quality grading standard | SJ/T 9561.9-1993 | |
| Grading standard for quality of carrier telephone equipment. Open wire high band 12 channel carrier telephone equipment | SJ/T 9523.3-1993 | |
| Methods of measurement for regulated current of silicon current regulator diodes | SJ 2138-1982 | |
| Requirements of readiness and methods of inspection and assessment for ED-401 wafer loading machines | SJ/T 31075-1994 | |
| Detail specification for silicon PNP low frequency high voltage high power transistors, Type 3CD267 and 3CD467 | SJ 2375-1983 | |
| Specification for PVTSiC76SI1-BP01 type silicon carbide single crystal polishing sheet | SJ 21122-2016 | |
| YC-type circular connectors for audio equipment--Quality grading standard | SJ/T 9555.6-1993 | |
| Detailed specifications for electronic components - 3DG79 forward AGC low-noise transistor for high-frequency (Applicable for certification) | SJ/T 10788-1996 | |
| Specifications for determination of 0. 5W, 1W, 3W metal oxide film resistors used for VCR | SJ/Z 9177-1995 | |
| Types and dimensions of single-hole mounting bushes of electronic components | SJ/T 10733-1996 | |
| Unsealed sub-miniature solid relay--Quality grading standard | SJ/T 9560.22-1993 | |
| KFC-C02 repairable lever switch--Quality grading standard | SJ/T 9561.17-1993 | |
| Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG145 | SJ 2284-1983 | |
| Model 713 Weather radar | SJ/T 10191-1991 | |
| Coaxial communication cables - Part 8-2: 50-047 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications | SJ/T 11520.8.2-2015 | |
| Detail specification for N channel junction field-effect low power switching transistors, Type CS36 | SJ 2093-1982 | |
| Guide for Typical Parameter Description of Military Electronic Components | SJ/Z 21146-2016 | |
| Synchronous motors for use in DT system timing devices--Quality grading standard | SJ/T 9559.10-1993 | |
| Preparation methods for electrical skeletons--Terminal diagram and table | SJ/T 10148.6-1991 | |
| Safety requirements for single-phase A. C. power supply switches | SJ 3274-1990 | |
| Safety requirements for components and assemblies at high voltage | SJ/T 3273-1990 | |
| Quality assessment of soldered joints of SMA | SJ/T 10666-1995 | |
| Grading standard of quality for television transposer | SJ/T 9507-1993 | |
| Method of measurement for maximum operational frequency of silicon single phase bridge rectifiers, up to 5A | SJ 1789-1981 | |
| Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders | SJ/T 10881-1996 | |
| Detail specification for electronic component. Semiconductor integrated circuit-type CD 7668 GP dual preamplifiers with ALC | SJ/T 10265-1991 | |
| Structural Analysis of Tantalum Capacitors | SJ 21230-2016 | |
| Time code and control code for video tape recorder | SJ/Z 9123-1987 | |
| Detailed specifications for electronic components - 2CZ323 ambient-rated silicon rectifier diodes (Applicable for certification) | SJ/T 10952-1996 | |
| YD100 Dynamic composite-cone loudspeakers of direct radiat type with two-magnet systems | SJ/T 10357-1993 | |
| General procedures of measurement for light-emitting deivces | SJ 2355.1-1983 | |
| Basic environmental testing procedures--Part 2: Tests--Test N: Change of temperature | SJ/Z 9001.4-1987 | |
| Printed board general specification | SJ 21192-2016 | |
| Verification regulation of KDK double gate FET Yfs tester | SJ 20231-1993 | |
| Requirements of readiness and methods of inspection and assessment for water treating equipment | SJ/T 31452-1994 | |
| Detail specification for electronic component. Semiconductor integrated circuit. Type CH2021 4-bit up down synchronous binary counter (dual clock) | SJ/T 10070-1991 | |
| Specification for LCR automatic test instrument for Type ED2814 | SJ/T 10237-1991 | |
| Generic specification for hold type ferrite switch intended for applications at microwave frequencies | SJ 2405-1983 | |
| YDG50 Dynamic paper-cone tweeteers | SJ/T 10356-1993 | |
| Intermediate-frequency transformers with internal tuning capacitor (s) for colour television broadcast receivers | SJ 2947-1988 | |
| Specifications for determination of bipolar aluminum electrolytic capacitors used for VCR | SJ/Z 9184-1995 | |
| Detail specification for RFGB201-40 radio frequency power fixed resistors | SJ 58263/8-2016 | |
| Photometric and colorimetric methods of measurement for the light emitted by cathode-ray tube screens | SJ/Z 9020-1987 | |
| Detailed specifications for electronic components - CB14 fixed polystyrene film dielectric metal foil DC capacitors - Assessment level E (Applicable for certification) | SJ/T 11047-1996 | |
| Method for determination of trace methanane in electronic grade gases--Hydrogen flame ionization deteror method | SJ 2800-1987 | |
| Guidelines for quality in production (prosess preparafion) | SJ/T 10466.9-1993 | |
| Detailed specifications for electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes | SJ/T 10948-1996 | |
| Safety design requirement for military command and control equipments. Part 6：En讨ronmentworthinessdesign | SJ 21140.6-2016 | |
| GNYZ5 alkaline rechargeable battery | SJ/T 10288.13-1991 | |
| Basic size of the ribbon spools for drum line printers | SJ/T 10763-1996 | |
| Basic parameters requirements and methods of measurement on TV receiver with built-in satallite TV broadcast receiving unit | SJ/T 10704-1996 | |
| Coaxial cables with longitudinal hole polyethylene insulation for use in cabled distribution systems, Type SYKV-75-9, SYKGY-75-9 | SJ/T 10302.3-1992 | |
| Detailed specification of CY-YZ-103 gauge pressure sensor | SJ 54409/10-2016 | |
| General specification for flat plasma enhanced chemical vapor deposition equipment | SJ 21200-2016 | |
| Variable air dielectric vane trimmer capacitors for Type CW2 and CW2S | SJ 2240.2-1982 | |
| Key material selection and control requirements for aerospace grade tantalum capacitors | SJ 21231-2016 | |
| Quality grading standard for piezoelectric ceramic discriminators for SIF discriminator circuit of TV receivers | SJ/T 9571.3-1995 | |
| General specification for laser dampers | SJ 21126-2016 | |
| Requirements of readiness and methods of inspection and assessment for LOGPOINT2 light inserting benches | SJ/T 31341-1994 | |
| Requirements of readiness and methods of inspection and assessment for steam-water heat exchangers and steam headers | SJ/T 31463-1994 | |
| Specifications for determination of microphone used for VCR | SJ/Z 9202-1995 | |
| Specification for floppy disc driver for Type ZPC-9 | SJ/T 10116-1991 | |
| Generic specification for negative temperature coefficient thermistors used as voltage regulators | SJ 1559-1980 | |
| General specification for counting tubes | SJ/T 198-1980 | |
| Detailed specifications for electronic components - 2CC22 and 2CC27 silicon tuning variable capacitance diodes (Applicable for certification) | SJ/T 10979-1996 | |
| Standard for design of electric lighting in electronic industry | SJJ 21-1990 | |
| Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material | SJ 3249.1-1989 | |
| Telephone equipment | SJ/T 9167.4-1993 | |
| Raw porcelain laser cutting machine general specification | SJ 21116-2016 | |
| General specification for load cell | SJ 21133-2016 | |
| General specification for transformers of switched mode power supplies for use in color television broadcasting receivers | SJ 2916-1988 | |
| Technical data of type DH-706 electronic glass | SJ/T 10591.3-1994 | |
| Requirements of readiness and methods of inspection and assessment for potentiometer life test machines | SJ/T 31382-1994 | |
| Resistors, fixed, metal film, high stability, style RJ54. Detail specification | SJ 51929.6-1995 | |
| Detailed specifications for electronic components - 4CS1191 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification) | SJ/T 11056-1996 | |
| Detailed specifications for electronic components - Semiconductor integrated circuits - CT1010 TTL Triple 3-input positive-NAND gate (Applicable for certification) | SJ/T 10812-1996 | |
| Resistors, fixed, metal film, high stability, style RJ52. Detail specification | SJ 51929.4-1995 | |
| Non-ionizing radiation hazard in frequency range of 10 -- 300, 000 MHz | SJ/Z 9030-1987 | |
| Demands for hydrogen-control of multi-chip microwave module -Part2:Test method for hydrogen releasing amount | SJ 21565.2-2020 | |
| Nominal frequency series for tuning fork and tablet resonators | SJ 1751-1981 | |
| CRT display terminations for digital computers--Quality grading standard | SJ/T 9531-1993 | |
| Specifications for determination of 2W flame-retardant power type wirewound resistors used for VCR | SJ/Z 9178-1995 | |
| Method of inspection for silicon epitaxial wafers | SJ 1550-1979 | |
| Military software quality measurement-Reliability--Part 3: Testing method | SJ/Z 21238.3-2016 | |
| KFC-C03 ajusting lever switch--Quality grading standard | SJ/T 9561.18-1993 | |
| Microwave Component Product Design Guide | SJ 21151-2016 | |
| First supplement to IEC368 (1971) of piezoelectric filters Chapter 3: Guide to the use of piezoelectric filters | SJ/Z 9153.2-1987 | |
| Specifications for determination of 3CG1321 type (2SB1321-TA) low-power transistors and similar products used for VCR | SJ/Z 9170-1995 | |
| LCD backlight assembly Part 3-5: Blank detail specification for LED backlight assembly for household appliances | SJ/T 11460.3.5-2019 | |
| Temperature control unit for quartz crystal elements | SJ/Z 9158-1987 | |
| Military software quality measurement-Reliability--Part 2: Measurement method | SJ/Z 21238.2-2016 | |
| Detail specification for electronic components--Fixed oil dipped paper dielectric capacitors for Type CZ61 for use in a. c. motors | SJ 2601.1-1985 | |
| General specification for shielding mash gaskets with elastomer core | SJ 20597-1996 | |
| Grading standard for quality of carrier telephone equipment. Power line carrier telephone equipment | SJ/T 9523.11-1993 | |
| Requirements of readiness and methods of inspection and assessment for jolt-squeeze molding machines | SJ/T 31041-1994 | |
| Verification regulation of model QF 3370 frequency counter | SJ 20227-1993 | |
| Power supply filter inductor for colour TV recievers--Quality grading standard | SJ/T 9553.1-1993 | |
| Piezoelectric ceramic filters for use in electronic equipment. Detail specification for Piezoelectric ceramic filter type LT465K-2. Assessment level E | SJ/T 10010-1991 | |
| Specification for single - pole three - throw switch chip for WXK0812-103 | SJ 21136-2016 | |
| Measurement of intermodulation distortion ration of power klystrons | SJ 1714-1981 | |
| Specification for PVTCdSN1/T-BP01 type cadmium sulfide single crystal polishing sheet | SJ 21121-2016 | |
| Air dielectric tubular (piston type) trimmer variable capacitors | SJ 20032-1992 | |
| Verification regulation of model 201/2 envelope delay measuring set | SJ 20226-1993 | |
| Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification, Type 3DD820 | SJ 3128-1988 | |
| Specifications for printed boards for TV broadcast receivers | SJ/T 11051-1996 | |
| Piezoelectric and dielectric devices for frequency control and selection Terminology Part 2: Piezoelectric and dielectric filters | SJ/T 11743.2-2019 | |
| Information Technology Small Computer System Interface(SCSI-3) Primary command layer Part 6: Block commands | SJ 20820.6-2002 | |
| Military Software Quality Measurement - Efficiency Part 2: Measurement Methods | SJ 21145.2-2016 | |
| Detailed specifications for electronic components - 3DD203 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification) | SJ/T 10967-1996 | |
| Detail specification for silicon PNP epitaxial planar low power switching transistors, Type 3CK120 | SJ 1846-1981 | |
| Capstan motor for V·T·R, general specification for | SJ/T 10476-1994 | |
| Detail specification for high voltage silicon rectifier stacks, Type 2CL30~33, 2DL30~33, 2CL40~43 and 2DL40~43 | SJ 1944-1981 | |
| Basic environmental testing procedures--Part 2: Tests--Test Z/AMD: Combined sequential cold, low air presure, and damp heat test | SJ/Z 9001.11-1987 | |
| Basic environmental testing procedures--Part 2: Tests--Test Ed: Free fall | SJ/Z 9001.26-1987 | |
| Requirements of backdrill process control for printed circuit board | SJ 21554-2020 | |
| Measurements of electrical properties of electronic tubes and valves--Part 7: Measurement of equivalent noise resistance | SJ/Z 9010.7-1987 | |
| Technical data of type DB-495 electronic glass | SJ/T 10588.24-1994 | |
| Hand generators, Type FSW50 | SJ 2776-1987 | |
| YS2-type circular connectors for audio equipment--Quality grading standard | SJ/T 9555.5-1993 | |
| Methods of measurement for uni-junction transistors | SJ/T 10333-1993 | |
| Fixed resistors for use in electronic equipment--Quality grading standard | SJ/T 9549-1993 | |
| Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification, Type 3DD871 | SJ 3127-1988 | |
| Requirements of readiness and methods of inspection and assessment for vacuum exhaust furnaces | SJ/T 31149-1994 | |
| Detailed specifications for electronic components - Semiconductor integrated circuits - CT1030 TTL8 input positive-NAND gate (Applicable for certification) | SJ/T 10815-1996 | |
| General specification for suppressed noise zinc oxide varistors | SJ 2309-1983 | |
| Microwave component connection installation process technical requirements | SJ 21157-2016 | |
| Specifications for determination of 0. 5W organic solid resistors used for VCR | SJ/Z 9172-1995 | |
| Generic specification for magnet assemblies for color purity and static convergence used in color TV receivers | SJ 2879-1988 | |
| Connectors, electrical, miniature, coaxial, environment resistant type, coaxial, plug, series I, class G, type 1. Detail specification | SJ 51920.7-1995 | |
| Detail specification for brushless dual - channel rotary conveyor for J124XFSW001 type | SJ 52143/3-2016 | |
| Type N radio-frequency coaxial connectors | SJ/T 11071-1996 | |
| Glass tube for black-white picture tubes, monochrome displayer tube and electro-optic source | SJ/T 11198-1999 | |
| General rules for 3D modeling of military electronic equipment - Part 3: Assembly modeling | SJ 21112.3-2016 | |
| Semiconductor photocouplers in the transistor mode | SJ 2219-1982 | |
| Grading standard for quality of carrier telephone equipment. 3-channel carrier telephone over/cable equipment | SJ/T 9523.1-1993 | |
| Terrestrial silicon solar cells and batteries--Quality grading standard | SJ/T 9550.30-1993 | |
| Measurements of electrical properties of electronic tubes and valves--Part 1: Measurement of electrode current | SJ/Z 9010.1-1987 | |
| Verification regulation of YG series coil number tester | SJ 20241-1993 | |
| Capability detail specification: single and double sided printed boards with plated-through holes | SJ/T 10716-1996 | |
| Radio - frequency cables Part 3-2: Coaxial cables for digital communication in horizantal floor wiring-Detail specification for coaxial cables with foamed dielectric for local area networks of 185m reach and up to 10Mb/s | SJ/T 11253-2001 | |
| Microwave cooking appliances | SJ/T 9167.10-1993 | |
| Insulating tape | SJ/T 9167.12-1993 | |
| Printed board safety performance evaluation | SJ 21172-2016 | |
| Basic environmental testing procedures--Part 2: Tests--Test Eb: Bump | SJ/Z 9001.24-1987 | |
| GNYG4 alkaline rechargeable battery | SJ/T 10288.7-1991 | |
| Detailed specifications for polyphenylene oxide woven glass fabric copper clad laminates | SJ 52142/1-2003 | |
| Measurement conditions of power klystrons | SJ 1705-1981 | |
| Detailed specifications for electronic components - Semiconductor integrated circuits - CW723 multi-terminal adjustable voltage regulators (Applicable for certification) | SJ/T 10878-1996 | |
| Detailed specifications for electronic components - 3DG182 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification) | SJ/T 11053-1996 | |
| Specifications for determination of RF cable assembles used for VCR | SJ/Z 9200-1995 | |
| Electrical relays--Part 5: Insulation tests for electrical relays | SJ/Z 9073.2-1987 | |
| Design guidelines for hermetic package of SiP products | SJ/Z 21355-2018 | |
| Detail specification for silicon NPN epitaxial planar superhigh frequency low power transistors, Type 3DG115 | SJ 2277-1983 | |
| Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA308 | SJ 2672.8-1986 | |
| Considerations on determination of reference impedance of interference characteristics of household appliances and similar electrical equipment | SJ/Z 9031-1987 | |
| Dimensions of electronic tubes | SJ/Z 9017-1987 | |
| Detailed specifications for electronic components - Semiconductor integrated circuits - CD7176CP SIF amplifying circuits (Applicable for certification) | SJ/T 10783-1996 | |
| Requirements of readiness and methods of inspection and assessment for PET-5500 atmospheric pressure CVD systems | SJ/T 31125-1994 | |
| Method of measurement for forward voltage of silicon single phase bridge rectifiers, up to 5A | SJ 1786-1981 | |
| Unsealed miniature solid relay--Quality grading standard | SJ/T 9560.23-1993 | |
| Colour television broadcast receivers--Quality grading standard | SJ/T 9502-1991 | |
| Cable distribution system for sound and television signals--Graphical symbols | SJ 2708-1986 | |
| Connectors, electrical, miniature, coaxial, environment resistant type, coaxial, straight, hermetically sealed panel adapter, two jack ends, series III, class Y, type 5. Detail specification | SJ 51920.11-1995 | |
| Basic environmental testing procedures--Part 2: Tests--Test Fda: Random vibration wide band-Reproducibility high | SJ/Z 9001.20-1987 | |
| Methods of measurement for equipment used in terestrial radio-relay systems--Part 2: Measurements for sub-systems--Section 4: Frequency modulators | SJ/Z 9094.5-1987 | |
| Examples for preparation of design documents of electronic equipment | SJ/T 10718-1996 | |
| Stationary lead acid batteries--Quality grading standard | SJ/T 9550.26-1993 | |
| Gas-filled microwave switching tubes, Type RX-5 | SJ 2008-1982 | |
| KW3 sensitive switch--Quality grading standard | SJ/T 9561.8-1993 | |
| General rule for use of sensitized plate using spectrum | SJ/Z 3206.4-1989 | |
| General specification for microwave assembly | SJ 20527-1995 | |
| KW5 sensitive switch--Quality grading standard | SJ/T 9561.2-1993 | |
| Mechanical standardization of semiconductor devices--Part 2: Dimensions | SJ/Z 9021.2-1987 | |
| Capability detail specification: multilayer printed boards | SJ/T 10717-1996 | |
| Quality grading standard for deflection yoke cores for color television receivers | SJ/T 9569.3-1995 | |
| Quality grading standard for low-frequency piezoelectric ceramic resonators | SJ/T 9571.1-1995 | |
| Sound system equipment. Part 10: Programme Level meters | SJ/Z 9140.4-1987 | |
| Switches, toggle, environmentally sealed, style KNE09. Detail specification | SJ 50735.3-1994 | |
| Detail specification for silicon PNP epitaxial planar low frequency high power transistors, Type 3CD553, 3CD554 and 3CD653 | SJ 2379-1983 | |
| Fibre optic branching devices--Part 1: Generic specification | SJ/Z 9023-1987 | |
| Detail specification for silicon NPN forward AGC high frequency low power transistors, Type 3DG254 | SJ 1673-1980 | |
| P-type connectors--Quality grading standard | SJ/T 9555.1-1993 | |
| Detailed specifications for electronic components - Semiconductor integrated circuits - CE10102 ECL Quad 4-input NOR gate (Applicable for certification) | SJ/T 10841-1996 | |
| Requirements of readiness and methods of inspection and assessment for 786-HT separators | SJ/T 31103-1994 | |
| Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices | SJ 2355.7-1983 | |
| Grading standard for quality of carrier telephone equipment. 300-channel carrier telephone small core coaxial cable equipment | SJ/T 9523.9-1993 | |
| Packaging of components for automatic assembly Part 1: Tape packaging of components with axial lead | SJ/Z 9034-1987 | |
| Mercury wetted contact relay--Quality grading standard | SJ/T 9560.15-1993 | |
| MEMS inertial device dry etching process technical requirements | SJ 21169-2016 | |
| Piezoelectric and dielectric devices for frequency control and selection Terminology Part 4-4: Materials Materials for surface acoustic wave devices | SJ/T 11743.4.4-2019 | |
| Grading standard of quelity for frequency converter used in cabled distribution systems primarily intended for sound and television signals operating between 30MHz and 1GHz | SJ/T 9508.8-1993 | |
| Detail specification for silicon NPN epitaxial planar superhigh frequency low power transistors, Type 3DG44 | SJ 2272-1983 | |
| Power travelling wave tubes, Type B-218 | SJ 2013-1982 | |
| BHC-1-3 type epoxy-improved molding plastics for electronic device | SJ/T 10256-1991 | |
| Grading standard of quality for single and double sided printed boards with plated-through holes | SJ/T 9545-1993 | |
| Detailed specification of high-power solid-state amplifier for microwave component WZFD0811-60 | SJ 20527/9-2016 | |
| Requirements of readiness and methods of inspection and assessment for resistor capping machines | SJ/T 31266-1994 | |
| KPCA frequency channel selector switch--Quality grading standard | SJ/T 9561.23-1993 | |
| 20GNC25-(2) Detailed specification for cadmium nickel battery packs for aviation | SJ 52181/2-2016 | |
| Blank detail specification for step-function recovery diodes | SJ 2747-1987 | |
| General specification for military electronic test equipment. Enviremental requirements and test methods | SJ 20372-1993 | |
| Detail specification for low frequency low noise field-effect transistors, Type CS12 | SJ 1985-1981 | |
| Detail specification for MG - B - 6P cable assemblies | SJ 54411/1-2016 | |
| Detail specification for N channel junction pair field-effect transistors, Type CS20 | SJ 1990-1981 | |
| Detailed specifications for electronic components - 3DG130A-3DG130D ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification) | SJ/T 10770-1996 | |
| Detail specification for monochrome display tube of type 5SG31Y43 | SJ 20463/13-2003 | |
| Piezoelectric ceramic filters for use in electronic equipment. Detail specification for Piezoelectric ceramic band-pass filters type. LT48B~LT116B, LT68D~LT80D, LT120D~LT124D and LT124B~LT172B for use in carrier Assessment Level E | SJ/T 10007-1991 | |
| Lead acid batteries for use in engine--Quality grading standard | SJ/T 9550.27-1993 | |
| Detail specification for silicon PNP epitaxial planar low frequency high power transistors, Type 3CD555, 3CD556 and 3CD655 | SJ 2380-1983 | |
| Rotary wafer switches (low current rating) with central mounting, maximum number of positions 12, maximum diameter 55mm, Type KX11 | SJ 2690-1986 | |
| Fixed metallized polyacrylate film dielectric d. c. capacitors--Quality grading standard | SJ/T 9503.9-1991 | |
| Quality grading standard for permanent ferrite magnets for loudspeakers | SJ/T 9569.7-1995 | |
| Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG151 | SJ 2289-1983 | |
| Microwave component component selection guide | SJ 21152-2016 | |
| Grading standard for quality of carrier telephone equipment. Open wire high band 3-channel carrier telephon equipment | SJ/T 9523.7-1993 | |
| Measurement of oscillation frequency of power klystrons | SJ 1719-1981 | |
| 20GNG40A aviation cadmium nickel battery pack detailed specification | SJ 52181/5-2016 | |
| Quality grading standard for E cores made of magnetic oxides | SJ/T 9569.2-1995 | |
| Double insulation systems for use in electrical equipment | SJ/T 9167.7-1993 | |
| Rotary wafer switches (low current rating), with central mounting, maximum number of positions; 12, maximum diameter: 55mm, Type KX01 | SJ 119-1986 | |
| Technological verification procedures for polishing equipment | SJ 21259-2018 | |
| Expression of performance of air quality infra-red analyzers | SJ/Z 9126-1987 | |
| A. C. motor capacitors | SJ 10687-1995 | |
| Requirements of readiness and methods of inspection and assessment for P436 6-station exhaust tables | SJ/T 31155-1994 | |
| Series of construction types and dimensions for vacuum capacitors | SJ/T 10637-1995 | |
| Detail specification of absolute pressure sensors for type CY-YZ-003 | SJ 54409/2-2003 | |
| Requirements of readiness and methods of inspection and assessment for high voltage switch cabinets | SJ/T 31401-1994 | |
| Aluminium electrolyte capacitors for use in a. c. motors--Quality grading standard | SJ/T 9503.17-1991 | |
| Detail specification for electronic components AY10×100 medium wave ferrite core. Assessment level A | SJ/T 10023-1991 | |
| Bidirectional align bonding sheet | SJ 2435.3-1984 | |
| Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator | SJ/T 10804-1996 | |
| Detailed specifications for electronic components - 3DG107 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification) | SJ/T 10955-1996 | |
| Detail specification for N channel junction pair field-effect transistors, Type CS29 | SJ 1999-1981 | |
| Detail specification for piezoelectric ceramic filters for use in electronic equipment. Type LT 455W piezoelectric ceramic filters. Assessment Level E | SJ/T 11139-1997 | |
| KDC-A01 power supply switch--Quality grading standard | SJ/T 9561.19-1993 | |
| Detail specification for N channel junction pair field-effect transistors, Type CS30 | SJ 2000-1981 | |
| Specification for thermal design of air-borne radar | SJ 3224-1989 | |
| Method of measurement for reverse current of light-emitting devices | SJ 2355.3-1983 | |
| Second supplement to IEC368 (1971) of piezoelectric filters Chapter 3 Guide to the use of piezoelectric filters | SJ/Z 9153.3-1987 | |
| KPCE frequency channel selectro switch--Quality grading standard | SJ/T 9561.27-1993 | |
| Sealed miniature solid relay--Quality grading standard | SJ/T 9560.21-1993 | |
| Surface acoustic wave (SAW) filters for IF circuit of black-and-white TV receivers Assessment level E | SJ 2970-1988 | |
| Resistor network, fixed, film, surface mount, established reliability, style RNK5085 detail specification for | SJ 20794-2-2007 | |
| Military command and control equipment - Safety design requirements - Part 1: General guidelines | SJ 21140.1-2016 | |
| Detail specification for low frequency field-effect transistors, Type CS1 | SJ 1974-1981 | |
| Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG151 | SJ 2290-1983 | |
| Diskette drivers--Quality grading standard | SJ/T 9543-1993 | |
| MEMS inertial device dicing process technical requirements | SJ 21166-2016 | |
| Detailed specifications for electronic components - 3DD325 silicon NPN ambient-rated transistors for low frequency amplification (Applicable for certification) | SJ/T 10974-1996 | |
| Military software C/C ++ Programming requirements Part 3: Naming, defining and declaring | SJ 21141.3-2016 | |
| Loading motor for V·T·R general specification for | SJ/T 10475-1994 | |
| MEMS inertial device lithography process technical requirements | SJ 21171-2016 | |
| Continuous wave power amplification klystrons, Type KF-115 | SJ 1869-1981 | |
| Semiconductor discrete device Detail specification for NPN silicon low-power switching transistor for type 3CK3634~3CK3637 | SJ 20177-1992 | |
| GNYZ0. 18 alkaline rechargeable battery | SJ/T 10288.10-1991 | |
| Variable air dielectric vane trimmer capacitors for Type CW5 and CW5S | SJ 2240.8-1982 | |
| Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG143 | SJ 2282-1983 | |
| Guidelines of techological design review | SJ/T 10466.17-1994 | |
| Methods of measurement for current temperature coefficient of silicon current regulator diodes | SJ 2142-1982 | |
| Guide to Quality assurance system for electric industrial enterprises | SJ/Z 2740-1986 | |
| A. C. tachomotor--Quality grading standard | SJ/T 9559.4-1993 | |
| Detail specification for N series RF coaxial connectors | SJ 50681/1A-2016 | |
| Semiconductor discrete device. Detail specification for silicon NPN low power switching transistor of type 3DK103 | SJ 20056-1992 | |
| Military software C/C ++ Programming requirements - Part 5: Functions, pointers and classes | SJ 21141.5-2016 | |
| Dimensions for square cores (RM-cores) made of magnetic oxides and for their associated parts | SJ 2744-1987 | |
| Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification, Type 3DD869 | SJ 3126-1988 | |
| Detailed specification of high-power solid-state amplifier for microwave component WZFD1516-600 | SJ 20527/11-2016 | |
| Requirements of readiness and methods of inspection and assessment for resistor butt-welding machines | SJ/T 31268-1994 | |
| Technical requirements and methods of measurement for UHF mechanical tuners used in monochrome TV broadcast receivers | SJ 2485-1984 | |
| Treatment methods for sensitized plate and film photograph for chemical analysis using spectrum | SJ/Z 3206.5-1989 | |
| Black and white TV manufacturing products comparable energy consumption per unit of production quotas | SJ/T 31474-1995 | |
| Coaxial radio-frequency cables with solid polytruoroethylene dielectric insulation--Quality grading standard | SJ/T 9556.2-1993 | |
| Overvoltage protection for photovoltaic (PV)power generating systems. Guide | SJ/T 11127-1997 | |
| Grading standard of quelity for channel amplifier used in cabled distribution systems primarily intended for sound and television signals operating between 30MHz and 1GHz | SJ/T 9508.5-1993 | |
| Requirements of readiness and methods of inspection and assessment for final reaction systems | SJ/T 31115-1994 | |
| Detail specification for silicon NPN diffused mesa low-frequency high power transistors, Type 3DD162 and 3DD163 | SJ 1641-1980 | |
| Type C film dielectric preset variable capacitors--Quality grading standard | SJ/T 9551.4-1993 | |
| Grading standard of quality for printed boards for broadcasting TV receivers | SJ/T 9544-1993 | |
| Key points for manufacture quality control of aluminium electrolytic capacitors | SJ/T 10222-1991 | |
| Disturbances in power supply systems caused by household appliances and similar electrical equipment Part 2: Harmonic waves | SJ/Z 9029.2-1987 | |
| KPCD frequency channel selector switch--Quality grading standard | SJ/T 9561.26-1993 | |
| Specifications for determination of 50V metalized polyester film dielectric DC fixed capacitors used for VCR | SJ/Z 9193-1995 | |
| Measurements of electrical properties of electronic tubes and valves--Part 3: Measurement of equivalent input and output admittances | SJ/Z 9010.3-1987 | |
| Semiconductor discrete device. Detail specification for silicon switching diode for type 2CK105 | SJ 20070-1992 | |
| Specifications for determination of low-current-leakage aluminum electrolytic capacitors used for VCR | SJ/Z 9185-1995 | |
| Lithium sulfar dioxide cylindrical cells--Quality grading standard | SJ/T 9550.18-1993 | |
| Generic specification for visible light photoresistors | SJ 2029-1982 | |
| General specification for VHS video cassette | SJ/T 10524-1994 | |
| General inspection principles of stampings | SJ/T 10726-1996 | |
| Requirements of readiness and methods of inspection and assessment for MP010 multi-purpose solderability test apparatuses | SJ/T 31127-1994 | |
| Detail specification for transmitting tube of type FU101F | SJ 20021-1992 | |
| Detail specification for oscilloscope of type 20SJ260Y14 | SJ 20463/16-2003 | |
| Tantalum capacitors with solid electrolyte--Quality grading standard | SJ/T 9503.2-1991 | |
| General specification for naval shore base standard display console | SJ 21139-2016 | |
| Sputtering ion pump--Testing methods | SJ 1781-1981 | |
| Detail specification for silicon PNP epitaxial planar low power switching transistors, Type 3CK100 | SJ 1841-1981 | |
| Single align tooth bonding sheet | SJ 2432.3-1984 | |
| Specifications for determination of trimming capacitors used for VCR | SJ/Z 9194-1995 | |
| Grading standard for telephoe | SJ/T 9521-1993 | |
| GNYG0. 45 alkaline rechargeable battery | SJ/T 10288.1-1991 | |
| Blank detail specification for magnet assemblies for color purity and static convergence used in color TV receivers Assessment level A | SJ 2880-1988 | |
| Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors, Type 3DA301 | SJ 2672.1-1986 | |
| Measurements of electrical properties of electronic tubes and valves--Part 5: Methods of measuring hiss and hum | SJ/Z 9010.5-1987 | |
| Quartz crystal unit terms | SJ/T 10639-1995 | |
| Technical data of type DB-472 electronic glass | SJ/T 10588.19-1994 | |
