| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB/T 42907-2023 |
Test method for excess-charge-carrier recombination lifetime in silicon ingots,silicon bricks and silicon wafers―Noncontact eddy-current sensor |
$255.00 |
via email in 1~3 business day |
valid,,2024-3-1 |
|
| GB/T 43092-2023 |
Electrochemical performance test of lithium ion battery cathode materials—Test method for high temperature performance |
$320.00 |
via email in 1~3 business day |
valid,,2024-4-1 |
|
| GB/T 43093-2023 |
Electrochemical performance test of lithium nickel manganese oxide—Test method for the initial discharge specfic capacity and initial efficiency |
$240.00 |
via email in 1~3 business day |
valid,,2024-4-1 |
|
| GB/T 43096-2023 |
Metallic powders—Determination of envelope-specific surface area from measurements of the permeability to air of a powder bed under steady-state flow conditions |
$400.00 |
via email in 1~5 business day |
valid,,2024-4-1 |
|
| GB/T 4326-1984 |
Extrinsic semiconductor single crystals; Measurement of Hall mobility and Hall coefficient |
$150.00 |
via email in 1~3 business day |
abolished2006-11-01,2006-11-1,1985-3-1 |
|
| GB/T 4326-2006 |
Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient |
$210.00 |
via email in 1~3 business day |
valid,,2006-11-1 |
|
| GB/T 43313-2023 |
Test method for surface quality and micropipe density of polished silicon carbide wafers—Confocal and differential interferometry optics |
$195.00 |
via email in 1~3 business day |
valid,,2024-6-1 |
|
| GB/T 43315-2023 |
Test method for flow pattern defects in silicon wafer—Etching technique |
$195.00 |
via email in 1~3 business day |
valid,,2024-6-1 |
|
| GB/T 4339-1999 |
Testing method for thermal expansion characteristic parameters of metallic materials |
$165.00 |
via email in 1~3 business day |
superseded,2009-5-1,2000-8-1 |
|
| GB/T 4339-2008 |
Test methods for thermal expansion characteristic parameters of metallic materials |
$300.00 |
via email in 1~3 business day |
valid,,2009-5-1 |
|
| GB/T 43894.1-2024 |
Practice for determining semiconductor wafer near-edge geometry—Part 1:Measured height data array using a curvature metric（ZDD） |
$195.00 |
via email in 1~3 business day |
valid,,2024-11-1 |
|
| GB/T 44330-2024 |
Lithium-ion battery cathode materials—Determination of powder compaction density |
$210.00 |
via email in 1~3 business day |
valid,,2025-3-1 |
|
| GB/T 44371-2024 |
Critical bending diameter measurement—Critical bending diameter measurement of Bi-2223 superconducting wires in liquid nitrogen temperature |
$315.00 |
via email in 1~5 business day |
valid,,2025-3-1 |
|
| GB/T 44558-2024 |
Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy |
$270.00 |
via email in 1~3 business day |
valid,,2025-4-1 |
|
| GB/T 5026-1985 |
The measurement method of amplitude permeability of soft magnetic alloys |
$264.00 |
via email in 1~3 business day |
abolished2009-05-01,2009-5-1,1986-1-1 |
|
| GB/T 5162-2021 |
Metallic powders—Determination of tap density |
$90.00 |
immediately |
valid,,2021-10-1 |
|
| GB/T 5163-2006 |
Sintered metal materials，excluding hardmetals - Permeable sintered metal materials - Determination of density，oil content，and open porosity |
$110.00 |
via email in 1~3 business day |
valid,,2006-11-1 |
|
| GB/T 5164-1985 |
Permeable sintered metal materials; Determination of open porosity |
$180.00 |
via email in 1~3 business day |
superseded,2006-11-1,1986-2-1 |
|
| GB/T 5166-1998 |
Sintered metal materials and hardmetals-Determination of Youngs modulus |
$85.00 |
via email in 1~3 business day |
superseded,2024-3-1,1999-8-1 |
|
| GB/T 5167-1985 |
Sintered metal materials and hardmetals; Determination of electrical resistivity |
$264.00 |
via email in 1~3 business day |
superseded,2019-6-1,1986-2-1 |
|
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* Related standard quantity: * Page quantity: *
Current: * First
Previous
[7][8][9][10][11][12][13][14][15][16][17]
Next
End
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