Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
GB/T 4184-2021 |
Tungsten-rhenium alloy wires |
$225.00 |
via email in 1~3 business day |
valid,,2022-7-1 |
|
GB/T 4185-2017 |
Molybdenum-tungsten alloy bars and rods |
$270.00 |
via email in 1~3 business day |
valid,,2018-2-1 |
|
GB/T 4186-1984 |
Molybdenum tungsten alloy rods |
$184.00 |
via email in 1~3 business day |
superseded,2002-12-1,1984-11-1 |
|
GB/T 4186-2002 |
Molybdenum-tungsten alloy rods |
$224.00 |
via email in 1~3 business day |
superseded,2018-2-1,2002-12-1 |
|
GB/T 4187-2017 |
Tungsten bars and rods |
$120.00 |
via email in 1~3 business day |
valid,,2018-2-1 |
|
GB/T 4188-2017 |
Molybdenum bars and molybdenum rods |
$120.00 |
via email in 1~3 business day |
valid,,2018-2-1 |
|
GB/T 4194-2017 |
Creep testing,high temperature treatment and metallographic examination of the tungsten wire |
$90.00 |
via email in 1~3 business day |
valid,,2018-2-1 |
|
GB/T 4314-2000 |
Getter terms |
$210.00 |
via email in 1~3 business day |
superseded,2018-7-1,2000-8-1 |
|
GB/T 4314-2017 |
Getter terms |
$310.00 |
via email in 1~5 business day |
valid,,2018-7-1 |
|
GB/T 43493.1-2023 |
Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 1: Classification of defects |
$375.00 |
via email in 1~3 business day |
valid,,2024-7-1 |
|
GB/T 43493.2-2023 |
Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 2: Test method for defects using optical inspection |
$375.00 |
via email in 1~3 business day |
valid,,2024-7-1 |
|
GB/T 43493.3-2023 |
Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 3: Test method for defects using photoluminescence |
$375.00 |
via email in 1~3 business day |
valid,,2024-7-1 |
|
GB/T 43724-2024 |
Test method for liquid crystal monomers |
$255.00 |
via email in 1~3 business day |
valid,,2024-10-1 |
|
GB/T 43771-2024 |
Electronic gas—Carbon monoxide |
$240.00 |
via email in 1~3 business day |
valid,,2024-10-1 |
|
GB/T 43772-2024 |
Electronic gas—Carbon dioxide |
$330.00 |
via email in 1~5 business day |
valid,,2024-10-1 |
|
GB/T 43773-2024 |
Electronic gas—Carbonyl sulfide |
$210.00 |
via email in 1~3 business day |
valid,,2024-10-1 |
|
GB/T 43774-2024 |
Test for stress of flat panel display substrate glass—Point scan method |
$135.00 |
via email in 1~3 business day |
valid,,2024-10-1 |
|
GB/T 43788-2024 |
Determination of silver content in silver paste for solar cells—Thiocyanate standard solution titration method |
$240.00 |
via email in 1~3 business day |
valid,,2024-10-1 |
|
GB/T 43793.1-2024 |
Test methods of color photoresist for flat panel display—Part 1: Physical and chemical properties |
$165.00 |
via email in 1~3 business day |
valid,,2024-10-1 |
|
GB/T 43793.2-2024 |
Test methods of color photoresist for flat panel display—Part 2: Optical properties |
$150.00 |
via email in 1~3 business day |
valid,,2024-10-1 |
|
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* Related standard quantity: * Page quantity: *
Current: * First
Previous
[8][9][10][11][12][13][14][15][16][17]
Next
End
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