2025-12-19 216.73.216.41
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials 220.0 via email in 1~3 business day to be superseded,2026-1-1,2006-11-1
GB/T 20175-2006 Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials 190.0 via email in 1~3 business day to be superseded,2026-1-1,2006-11-1
JB/T 10573-2006 Toolmakers microscope 270.0 via email in 1~3 business day superseded,2014-7-1,2006-10-1
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method 224.0 via email in 1~3 business day to be superseded,2026-1-1,2004-12-1
JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus 304.0 via email in 1~3 business day superseded,2012-4-1,2004-11-1
GB 7667-2003 The dose of X-rays leakage from electron microscope 30.0 via email in 1~3 business day valid,,2004-5-1
GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens 100.0 via email in 1~3 business day superseded2009-03-01,2009-3-1,2003-6-1
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis 100.0 via email in 1~3 business day to be superseded,2026-3-1,2003-6-1
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA) 120.0 via email in 1~3 business day valid,,2003-6-1
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis 160.0 via email in 1~3 business day superseded2023-02-01,2023-2-1,2003-6-1
GB/T 18735-2002 General specification of nanometer thin STANDARD specimen for analytical transmission electron microscopy (AEM/EDS) 264.0 via email in 1~3 business day superseded,2015-3-1,2002-12-1
GB 7247.1-2001 Safety of laser products--Part 1:Equipment classification,requirements and users guide 810.0 via email in 1~3 business day superseded2013-12-25,2013-12-25,2002-5-1
GB 18151-2000 Laser guards 744.0 via email in 1~5 business day superseded2009-10-01,2009-10-1,2000-1-2
JB/T 9322-1999 Spectrum projector 260.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
JB/T 9351-1999 General specifications of pachaging for electron optical instrument 220.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
JB/T 8239.1-1999 Basic parameters for diffraction grating 150.0 via email in 1~3 business day abolished2017-05-12 ,,2000-1-1
JB/T 8234-1999 Spectroscope 260.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
JB/T 9324-1999 Visible spectrophotometer 120.0 via email in 1~3 business day abolished2017-05-12 ,,2000-1-1
JB/T 9327-1999 Whiteness meter 264.0 via email in 1~3 business day abolished2010-01-20,,2000-1-1
JB/T 9331-1999 Slits for optical spectrum instruments 220.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
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GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials 
  Issued on: 2006-03-27   Price(USD): 220.0
GB/T 20175-2006 Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials 
  Issued on: 2006-03-27   Price(USD): 190.0
JB/T 10573-2006 Toolmakers microscope 
  Issued on: 2006-7-27   Price(USD): 270.0
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method 
  Issued on: 2004-4-30   Price(USD): 224.0
JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus 
  Issued on: 2004-06-17   Price(USD): 304.0
GB 7667-2003 The dose of X-rays leakage from electron microscope 
  Issued on: 2003-10-10   Price(USD): 30.0
GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens 
  Issued on: 2002-11-11   Price(USD): 100.0
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis 
  Issued on: 2002-11-11   Price(USD): 100.0
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA) 
  Issued on: 2002-11-11   Price(USD): 120.0
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis 
  Issued on: 2002-11-11   Price(USD): 160.0
GB/T 18735-2002 General specification of nanometer thin STANDARD specimen for analytical transmission electron microscopy (AEM/EDS) 
  Issued on: 2002-05-22   Price(USD): 264.0
GB 7247.1-2001 Safety of laser products--Part 1:Equipment classification,requirements and users guide 
  Issued on: 2001-11-5   Price(USD): 810.0
GB 18151-2000 Laser guards 
  Issued on: 2000-07-02   Price(USD): 744.0
JB/T 9322-1999 Spectrum projector 
  Issued on: 1999-08-06   Price(USD): 260.0
JB/T 9351-1999 General specifications of pachaging for electron optical instrument 
  Issued on: 1999-08-06   Price(USD): 220.0
JB/T 8239.1-1999 Basic parameters for diffraction grating 
  Issued on: 1999-8-6   Price(USD): 150.0
JB/T 8234-1999 Spectroscope 
  Issued on: 1999-08-06   Price(USD): 260.0
JB/T 9324-1999 Visible spectrophotometer 
  Issued on: 1999-8-6   Price(USD): 120.0
JB/T 9327-1999 Whiteness meter 
  Issued on: 1999-08-06   Price(USD): 264.0
JB/T 9331-1999 Slits for optical spectrum instruments 
  Issued on: 1999-08-06   Price(USD): 220.0
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