| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| SJ 2354.11-1983 |
Method of measurement for width of blind zone of PIN and avalanche photodiode matrix |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.12-1983 |
Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.13-1983 |
Method of measurement for multiplication factor of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.14-1983 |
Method of measurement for excess noise factor of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.2-1983 |
Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.3-1983 |
Method of measurement for dark current of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.4-1983 |
Method of measurement for forward voltage drop of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.5-1983 |
Method of measurement for capacitance of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.6-1983 |
Method of measurement for responsivity of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.7-1983 |
Method of measurement for spectral response curve and spectral response range of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.8-1983 |
Method of measurement for pulse rise time and fall time of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2354.9-1983 |
Method of measurement for noise equivalent power of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
| SJ 2355.1-1983 |
General procedures of measurement for light-emitting deivces |
$180.00 |
via email in 1~3 business day |
valid,,1984-7-1 |
|
| SJ 2355.2-1983 |
Method of measurement for forward voltage drop of light-emitting devices |
$180.00 |
via email in 1~3 business day |
valid,,1984-5-1 |
|
| SJ 2355.3-1983 |
Method of measurement for reverse current of light-emitting devices |
$180.00 |
via email in 1~3 business day |
valid,,1984-7-1 |
|
| SJ 2355.4-1983 |
Methods of measurement for junction capacitance of light-emitting devices |
$180.00 |
via email in 1~3 business day |
valid,,1984-7-1 |
|
| SJ 2355.5-1983 |
Method of measurement for luminous intensity and half-intensity angle of light-emitting devices |
$180.00 |
via email in 1~3 business day |
valid,,1984-7-1 |
|
| SJ 2355.6-1983 |
Method of measurement for luminous flux of light-emitting devices |
$180.00 |
via email in 1~3 business day |
valid,,1984-7-1 |
|
| SJ 2355.7-1983 |
Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices |
$180.00 |
via email in 1~3 business day |
valid,,1984-3-1 |
|
| SJ 50597/60-2004 |
Semiconductor integrated circuits Detail specification for types JW117/JW150/JW138 three terminal adjustable positive voltage reference |
$370.00 |
via email in 1~3 business day |
valid,,2004-12-1 |
|
* Related standard quantity: * Page quantity: *
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* Related standard quantity: * Page quantity: *
Current: * First
Previous
[24][25][26][27][28][29][30][31][32]
Next
End
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