| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| SJ 2658.1-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - General Rules |
$184.00 |
via email in 1~3 business day |
abolished2016-04-01,2016-4-1,1986-10-1 |
|
| SJ 2658.10-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Modulated Wideband |
$75.00 |
via email in 1~3 business day |
abolished2016-04-01,2016-4-1,1986-10-1 |
|
| SJ 2658.11-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Pulse Response Characteristics |
$75.00 |
via email in 1~3 business day |
abolished2016-04-01,2016-4-1,1986-10-1 |
|
| SJ 2658.12-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Peak Emission Wavelength and Spectral Half Width |
$75.00 |
via email in 1~3 business day |
abolished2016-04-01,2016-4-1,1986-10-1 |
|
| SJ 2658.13-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Output Optical Power Temperature Coefficient |
$75.00 |
via email in 1~3 business day |
valid,,1986-10-1 |
|
| SJ 2658.2-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Forward Voltage Drop |
$184.00 |
via email in 1~3 business day |
superseded,2016-4-1,1986-10-1 |
|
| SJ 2658.3-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Backward Voltage |
$184.00 |
via email in 1~3 business day |
superseded,2016-4-1,1986-10-1 |
|
| SJ 2658.4-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Capacitance |
$184.00 |
via email in 1~3 business day |
superseded,2016-4-1,1986-10-1 |
|
| SJ 2658.5-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Forward Series Resistance |
$184.00 |
via email in 1~3 business day |
superseded,2016-4-1,1986-10-1 |
|
| SJ 2658.6-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Output Optical Power |
$75.00 |
via email in 1~3 business day |
valid,,1986-10-1 |
|
| SJ 2658.7-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Radiant Flux |
$184.00 |
via email in 1~3 business day |
superseded,2016-4-1,1986-10-1 |
|
| SJ 2658.8-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Normal Radiance |
$75.00 |
via email in 1~3 business day |
superseded,2016-4-1,1986-10-1 |
|
| SJ 2658.9-1986 |
Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for the Intensity Space Distribution and Half-intensity Angle of Radiation |
$75.00 |
via email in 1~3 business day |
superseded,2016-4-1,1986-10-1 |
|
| SJ 53930/1-2002 |
Semiconductor optoelectronic devices detail specification for type GR8813 infrared emitting diode |
$120.00 |
via email in 1~3 business day |
valid,,2002-5-1 |
|
| T/CIE 093-2020 |
Electronic industry diagnosis of energy saving technical specification―Display device |
$315.00 |
via email in 1~5 business day |
valid,, |
|
| T/CIRA 9-2020 |
Lutetium[177Lu]chloride solution |
$165.00 |
via email in 1~3 business day |
valid,, |
|
| T/SLDA 013-2023 |
Evaluation methods for comfort of Mini/Micro LED direct displays |
|
via email in business day |
valid,,2023-12-31 |
|
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